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Kiyoshi Kawamoto
Observed names:
Kiyoshi KAWAMOTO,
カワモト, キヨシ
Institution:
The University of Tokyo
Observed institutions:
Osaka Prefecture University,
The University of Tokyo,
The University of Osaka
OpenAlex ID:
A5109003389
Quasi-Medium Energy Ion Scattering Spectroscopy Observation of a Ge δ-doped Layer Fabricated by Hydrogen Mediated Epitaxy
1998
·
Takashi Fuse
, Kiyoshi Kawamoto
, et al.
·
Japanese Journal of Applied Physics
·
8
PDF
Observation of the diffusion of Ag atoms through an a-Si layer on Si(111) by low-energy ion scattering
1996
·
Kiyoshi Kawamoto
, Tatsuo Mori
, et al.
·
Surface Science
·
8
Quasi-medium energy ion scattering spectroscopy observation of surface segregation of Ge δ-doped layer during Si molecular beam epitaxy
1997
·
Takashi Fuse
, Kiyoshi Kawamoto
, et al.
·
Surface Science
·
6
A New Apparatus for Impact Collision Ion Scattering Spectroscopy
1995
·
Kiyoshi Kawamoto
, Kei Inari
, et al.
·
Japanese Journal of Applied Physics
·
5
Quasi-medium energy ion scattering spectroscopy study of Ge δ-layer on Si(001)
1997
·
Takashi Fuse
, Kiyoshi Kawamoto
, et al.
·
Applied Surface Science
·
3
Observation of behavior of Ge δ-doped layer in Si(001)
1998
·
Takashi Fuse
, Kiyoshi Kawamoto
, et al.
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
·
2
Structure and Composition of Au-Cu Alloy Single Crystal Surface by Low Energy Ion Scattering Spectroscopy (ICISS).
1991
·
Kiyoshi KAWAMOTO
, Shigemitsu NAKANISHI
·
Shinku
·
2
PDF
Laser-Induced Photoluminescence Enhancement in a Room-Temperature Emitting SiGe-Based Alloy Quantum Well
2002
·
Daihei Hippo
, Yoshitaka Sugawara
, et al.
·
Japanese Journal of Applied Physics
·
1
In-situ observation of Ge δ-layer in Si(001) using quasi medium energy ion scattering spectroscopy
1999
·
Takashi Fuse
, Kiyoshi Kawamoto
, et al.
·
Materials Science in Semiconductor Processing
·
1
Laser-Induced Photoluminescence Enhancement in a Room-Temperature Emitting SiGe-Based Alloy Quantum Well : Semiconductors
2002
·
Daihei Hippo
, Yoshitaka Sugawara
, et al.
·
Japanese Journal of Applied Physics
Behavior of Ge .DELTA.-doped Layer in Si(001) Observed by TOF-LEIS.
1997
·
Takashi SHIIZAKI
, Takashi FUSE
, et al.
·
Hyomen Kagaku
PDF
Scattering Process of Low-Energy Ions from Binary Compound Surfaces at 180°
1995
·
Kiyoshi Kawamoto
, Kenjiro Oura Kenjiro Oura
·
Japanese Journal of Applied Physics
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Works count:
13
Citation count:
36
H-index:
4
I10-index:
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