Author

Kenneth S. M. Fung

Observed names: KENNETH S. M. FUNG, Kenneth S. M. Fung, Kenneth S. Fung, Kenneth S.M. Fung

Institution: ASM Pacific Technology (China)

Observed institutions: Chinese University of Hong Kong, Hong Kong Association of Registered Tour Co-ordinators, ASM Pacific Technology (China)

OpenAlex ID: A5109170144

An INSPECT Measurement System for Moving Objects

2014 · Fuqin Deng, Chang Liu, et al. · IEEE Transactions on Instrumentation and Measurement · 17

Structured-Light Based Sensing Using a Single Fixed Fringe Grating: Fringe Boundary Detection and 3-D Reconstruction

2008 · Jun Cheng, Chi-Kit Ronald Chung, et al. · IEEE Transactions on Electronics Packaging Manufacturing · 12

Three-dimensional reconstruction of wafer solder bumps using binary pattern projection

2005 · Jun Cheng, Ronald Chung, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12

Regularized multiframe phase-shifting algorithm for three-dimensional profilometry

2011 · Fuqin Deng, Wui Fung Sze, et al. · Applied Optics · 11

Height Inspection of Wafer Bumps Without Explicit 3-D Reconstruction

2010 · Mei Dong, Ronald Chung, et al. · IEEE Transactions on Electronics Packaging Manufacturing · 7

Projection optics design for tilted projection of fringe patterns

2008 · Yuan Shu, Ronald C. Chung, et al. · Optical Engineering · 7

EC-EGI: enriched complex EGI for 3D shape registration

2009 · Zhaozheng Hu, Ronald Chung, et al. · Machine Vision and Applications · 6

Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object

2012 · Fuqin Deng, Chang Liu, et al. · Optical Engineering · 5

A three-dimensional imaging system for surface profilometry of moving objects

2013 · Fuqin Deng, Jianyang Liu, et al. · IEEE International Conference on Imaging Systems and Techniques (IST) · 4

Optimization of Bit-pairing Codification With Learning for 3d Reconstruction

2007 · JUN CHENG, RONALD CHUNG, et al. · International Journal of Image and Graphics · 4

An edge detection algorithm based on rectangular Gaussian kernels for machine vision applications

2009 · Fuqin Deng, Kenneth S. M. Fung, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

Reference-free Machine Vision Inspection of Semiconductor Die Images

2009 · ADA N. Y. NG, EDMUND Y. LAM, et al. · International Journal of Image and Graphics · 3

A polynomial phase-shift algorithm for high precision three-dimensional profilometry

2013 · Fuqin Deng, Chang Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

An illumination-invariant phase-shifting algorithm for three-dimensional profilometry

2012 · Fuqin Deng, Chang Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

A novel design of grating projecting system for 3D reconstruction of wafer bumps

2006 · Yuan Shu, Ronald Chung, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Reference-free detection of semiconductor assembly defect

2005 · Ada N. Ng, Edmund Y. Lam, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

An elliptic phase-shift algorithm for high speed three-dimensional profilometry

2013 · Fuqin Deng, Zhao Li, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Handling of multi-reflections in wafer bump 3D reconstruction

2008 · Jun Cheng, Ronald Chung, et al. · Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics · 1

Publisher's Note: Projection optics design for tilted projection of fringe patterns

2008 · Yuan Shu, Jun Cheng, et al. · Optical Engineering · 1

An edge-from-focus approach to 3D inspection and metrology

2015 · Fuqin Deng, Jia Chen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Errata: Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object

2012 · Fuqin Deng, Chang Liu, et al. · Optical Engineering

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Use of paraplanar constraint for parallel inspection of wafer bump heights

2007 · Mei Dong, Ronald Chung, et al. · IPCV

Boundary detection of projected fringes on surface with inhomogeneous reflectance function

2006 · Jun Cheng, Ronald Chung, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Works count: 24

Citation count: 102

H-index: 6

I10-index: 4