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A. Benatmane
Observed names:
Abderrazzaq Benatmane,
BENATMANE, Abderrazzaq
Institutions:
Institut de Thermique, Mécanique, Matériaux,
Université de Reims Champagne-Ardenne
Observed institutions:
Centre National de la Recherche Scientifique,
Institut de Thermique, Mécanique, Matériaux,
Université de Reims Champagne-Ardenne
OpenAlex ID:
A5109366005
Large area, high resolution analysis of surface roughness of semiconductors using interference microscopy
2002
·
P.C. Montgomery
, A. Benatmane
, et al.
·
Materials Science and Engineering B
·
30
Rapid prototyping of diffractive optical elements for high-power lasers using laser ablation lithography fabrication and coherence probe microscopy analysis
2002
·
Manuel Flury
, A. Benatmane
, et al.
·
Optical Engineering
·
14
Interference microscopy for nanometric surface microstructure analysis in excimer laser processing of silicon for flat panel displays
2003
·
A. Benatmane
, P.C. Montgomery
, et al.
·
Applied Surface Science
·
11
Excimer laser ablation lithography applied to the fabrication of reflective diffractive optics
2003
·
M. Flury
, A. Benatmane
, et al.
·
Applied Surface Science
·
11
3D analysis of buried interfaces using interference microscopy
2004
·
A. Benatmane
, P. C. Montgomery
·
The European Physical Journal Applied Physics
·
10
2D discrete high order energy operators for surface profiling using white light interferometry
2003
·
F. Salzenstein
, P. Montgomery
, et al.
·
International Symposium on Signal Processing and Its Applications (ISSPA)
·
9
Heat Treatment Effects on the Microstructural and Mechanical Properties of Electrodeposited Cu-Ni Coatings
2024
·
A. Benatmane
, H. Dhiflaoui
, et al.
·
Journal of Materials Engineering and Performance
·
4
PDF
Multi-level relief structures in sol–gel and photoresist fabricated by laser ablation and analyzed with coherence probe microscopy
2007
·
E. Neiss
, M. Flury
, et al.
·
Applied Surface Science
·
3
Buried interface characterization by interference microscopy
2004
·
A. Benatmane
, P.C. Montgomery
·
Thin Solid Films
·
2
Développement de la microscopie interférométrique pour une meilleure analyse morphologique des couches minces et épaisses des matériaux semiconducteurs et optiques
2002
·
BENATMANE, Abderrazzaq
, MONTGOMERY, Paul
·
OpenGrey (Institut de l'Information Scientifique et Technique)
·
1
Mechanical, Tribological, and Electrical Properties of Silver-Doped Cu-Ni Alloy Elaborated by Pulsed Electrodeposition Technique
2026
·
A. Benatmane
, H. Dhiflaoui
, et al.
·
Journal of Materials Engineering and Performance
Fabrication of multilevel reflective diffractive optical elements by means of laser ablation lithography
2004
·
Sandrine Aubry
, Philippe Gerard
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Phase stepping microscopy for rapid control of laser crystallization of Si for flat panel display applications
2003
·
A. Benatmane
, Paul C. Montgomery
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
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Works count:
13
Citation count:
95
H-index:
6
I10-index:
5
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