Get started
Author

Chris Schuermyer

Observed name: C. Schuermyer
OpenAlex ID: A5109433539
Impact of multiple-detect test patterns on product quality
2004 · B. Benware, C. Schuermyer, et al. · IEEE International Test Conference (ITC) · 155
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis
2006 · Martin Keim, Nagesh Tamarapalli, et al. · IEEE International Test Conference (ITC) · 72
Screening minVDD outliers using feed-forward voltage testing
2003 · R. Madge, B.H. Goh, et al. · IEEE International Test Conference (ITC) · 68
In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost
2005 · R. Madge, B. Benware, et al. · IEEE International Test Conference (ITC) · 56
02 2012 64 64 6198433 10.1109/MDT.2012.2196611 http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198433 <![CDATA[ 02 2012 72 72 6198434 10.1109/MDT.2012.2196612 http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198434 <![CDATA[ 02 2012 79 79 6198435 10.1109/MDT.2012.2196613 http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198435 <![CDATA[Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results
2012 · Brady Benware, Chris Schuermyer, et al. · IEEE Design & Test of Computers · 49
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis
2009 · Manish Sharma, Chris Schuermyer, et al. · IEEE Design & Test of Computers · 27
Improving Fault Isolation Using Iterative Diagnosis
2008 · Kevin Gearhardt, Chris Schuermyer, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 23
Identification of systematic yield limiters in complex asics through volume structural test fail data visualization and analysis
2006 · C. Schuermyer, K. Cota, et al. · IEEE International Test Conference (ITC) · 21
Extracting Defect Density and Size Distributions from Product ICs
2006 · J.E. Nelson, T. Zanon, et al. · IEEE Design & Test of Computers · 18
Identifying systematic critical features using silicon diagnosis data
2012 · C. Schuermyer, S. Malik, et al. · ASMC proceedings · 15
Screening vdsm outliers using nominal and subthreshold supply voltage I/sub DDQ/
2004 · C. Schuermyer, B. Benware, et al. · IEEE International Test Conference (ITC) · 13
Device Selection for Failure Analysis of Chain Fails Using Diagnosis Driven Yield Analysis
2011 · Chris Schuermyer, Brady Benware, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 9
Minimum testing requirements to screen temperature dependent defects
2005 · C. Schuermyer, J. Ruffler, et al. · IEEE International Test Conference (ITC) · 8
Minimum testing requirements to screen temperature dependent defects
2004 · Chris Schuermyer, J. Ruffler, et al. · 8
A Hybrid Flow for Memory Failure Bitmap Classification
2012 · Jianbo Li, Yu Huang, et al. · Proceedings - Asian Test Symposium/Proceedings · 7
Silicon Evaluation of Static Alternative Fault Models
2007 · Chris Schuermyer, Jewel Pangilinan, et al. · IEEE VLSI Test Symposium (VTS) · 4
Application of Bayesian Machine Learning To Create A Low-Cost Silicon Failure Mechanism Pareto
2019 · Chris Schuermyer, Steve Palosh, et al. · ASMC proceedings · 3
Deploying New Nodes Faster with Machine Learning for IC Design and Manufacturing
2019 · Chris Schuermyer · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 3
A supervised ANN method for memory failure signature classification
2012 · Jianbo Li, Yu Huang, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 3
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data
2013 · Shobhit Malik, Thomas Herrmann, et al. · IEEE Design and Test · 2
Works count: 21
Citation count: 564
H-index: 11
I10-index: 11
Year
Topic
Type