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P. Smith

Observed name: Phil Smith
OpenAlex ID: A5109866740
A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging
2007 · K. Mistry, R. Chau, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 902
A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors
2004 · T. Ghani, M. Armstrong, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 596
A 14nm logic technology featuring 2nd-generation FinFET, air-gapped interconnects, self-aligned double patterning and a 0.0588 µm2 SRAM cell size
2014 · S. Natarajan, M. Agostinelli, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 562
Fabrication of 200 to 2700 GHz multiplier devices using GaAs and metal membranes
2002 · S. Martin, B. Nakamura, et al. · IEEE MTT-S International Microwave Symposium digest · 106
The UAVSAR instrument: Description and first results
2008 · Scott Hensley, Kevin Wheeler, et al. · IEEE Radar Conference (RadarConf) · 93
An active membrane phased array radar
2005 · A. Moussessian, L. Del Castillo, et al. · IEEE MTT-S International Microwave Symposium digest · 31
3.5-watt AlGaN/GaN HEMTs and amplifiers at 35 GHz
2004 · Y.-F. Wu, M. Moore, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 26
The Frame-less Membrane: A Novel Technology for THz Circuits
2000 · Imran Mehdi, J. Bruston, et al. · 14
Monolithic THz Frequency Multipliers
2001 · N. R. Erickson, Gopal Narayanan, et al. · Softwaretechnik-Trends · 7
Large Aperture, Scanning, L-Band SAR
2011 · Alina Moussessian, Linda Del Castillo, et al. · NASA Technical Reports Server (NASA) · 6
Aperture-coupled thin-membrane microstrip array antenna for beam scanning application
2005 · J. Huang, G. Sadowy, et al. · Digest - IEEE Antennas and Propagation Society. International Symposium · 6
A Cu interconnect process for the 130 nm process technology node
2001 · Peter C. Moon, C. Allen, et al. · 2
A 45nmLogicTechnology withHigh-k+Metal GateTransistors, Strained Silicon, 9CuInterconnect Layers, 193nmDryPatterning, and100%Pb-free Packaging
2007 · K. Mistry, C. C. Allen, et al.
In flight phased array alignment
2002 · P. Smith · Digest - IEEE Antennas and Propagation Society. International Symposium
Measurements of antenna gain in radar systems.
1974 · P. Smith · Microwave journal
Works count: 16
Citation count: 2,351
H-index: 8
I10-index: 8
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