Get started
Author

Rick Shih-Jye Shen

Observed names: R. Shen, R.S.J. Shen, Rick Shen, Shen, Rick Shih-Jye
OpenAlex ID: A5109898622
A PUF scheme using competing oxide rupture with bit error rate approaching zero
2018 · Meng-Yi Wu, Tsao-Hsin Yang, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 88
Neobit@ -High Reliable Logic Non-Volatile Memory (NVM)
2004 · Rick Shih-Jye Shen, Charles C. H. Hsu · 20
NeoFlash - True Logic Single Poly Flash Memory Technology
2006 · H.M. Lee, S.T. Woo, et al. · IEEE International Memory Workshop (IMW) · 16
A high-density logic CMOS process compatible non-volatile memory for sub-28nm technologies
2014 · Rick Shih-Jye Shen, Meng-Yi Wu, et al. · Symposium on VLSI Technology · 13
Neobit/sup /spl reg// - high reliable logic non-volatile memory (NVM)
2004 · R.S.C. Wang, R.S.J. Shen, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 11
ESD Avoiding Circuits for Solving OTP Memory Falsely Programmed Issues
2010 · Shao-Chang Huang, Ke-Horng Chen, et al. · IEEE Circuits and Systems Magazine · 7
Logic Non-Volatile Memory
2013 · Charles Ching-Hsiang Hsu, Yuan-Tai Lin, et al. · International series on advances in solid state electronics and technology · 4
New Self-Convergent Programming Method for Multilevel AND Flash Memory
1999 · Evans Ching-Song Yang, Wei-Jer Wong, et al. · Japanese Journal of Applied Physics · 4
PDF
New Self-Convergent Programming Method for Multi-Level AND Flash Memory
1998 · Evans Ching-Song Yang, Wei-Jer Wong, et al. · International Conference on Solid State Devices and Materials (SSDM) · 2
Highly reliable anti-fuse technology in sub-16nm technologies for security applications
2016 · Rick Shen, Hsin-Ming Chen, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 1
Flash memories
2000 · Rick Shih-Jye Shen, Frank Ruei-Ling Chou, et al. · 1
Flash Memories
2006 · Frank Ruei-Ling Lin, Rick Shih-Jye Shen, et al. · The electrical engineering handbook/Electrical engineering handbook series/Electrical engineering handbook
P-channel SONOS Transient Current Modeling for Program and Erase
2006 · Pei-ying Du, Jyh-chyurn Guo, et al. · IEEE International Power Modulator Symposium and High-Voltage Workshop (IPMHVC)
Flash Memories
2003 · Frank Ruei-Ling Lin, Rick Shih-Jye Shen, et al. · Principles and applications in engineering
3G CDMA Technologies Enabling Advanced Broadband Wireless Access Services
2000 · Rick Shih-Jye Shen
Flash Memories
1999 · Rick Shih-Jye Shen, Frank Ruei-Ling Lin, et al. · The electrical engineering handbook/Electrical engineering handbook series/Electrical engineering handbook
Works count: 17
Citation count: 167
H-index: 6
I10-index: 5
Year
Topic
Type