Author

Stefan Muench

Observed names: S. Muench, S. Münch
ORCID: 0000-0002-7379-2841
Observed ORCID: 0000-0002-7379-2841
OpenAlex ID: A5109978733
2013 · Stefan Muench, Edeltraud Guenther · Applied Energy · 255
2014 · Stefan Muench, Sebastian Thuss, et al. · Energy Policy · 74
2016 · Patrick Ilg, Christoph Scope, et al. · The International Journal of Life Cycle Assessment · 59
2014 · Stefan Muench · Journal of Cleaner Production · 47
2016 · Christoph Scope, Patrick Ilg, et al. · The International Journal of Life Cycle Assessment · 33
2023 · Darshankumar Bhat, Stefan Muench, et al. · e-Prime - Advances in Electrical Engineering Electronics and Energy · 30
2022 · S. Muench, D. Bhat, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 18
2020 · Lili Chen, Ulana Cikalova, et al. · Journal of sensors and sensor systems · 15
2023 · Darshankumar Bhat, Stefan Muench, et al. · Power Electronic Devices and Components · 9
2019 · Lili Chen, Ulana Cikalova, et al. · International Spring Seminar on Electronics Technology · 7
2017 · S. Muench, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 5
2022 · Darshankumar Bhat, Stefan Muench, et al. · International Spring Seminar on Electronics Technology · 4
2024 · Freerik Forndran, Mario Sprenger, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 2
2014 · Edeltraud Guenther, Stefan Muench, et al. · Academy of Management Proceedings · 1
2025 · Darshankumar Bhat, Stefan Muench, et al. · European Microelectronics and Packaging Conference
2024 · Darshankumar Bhat, Stefan Muench, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
2023 · Lennard Surner, Lili Chen, et al. · IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)
2021 · T. Härtling, M. Heymann, et al. · Sensor and Measurement Science International (SMSI)
Works count: 23
Citation count: 579
H-index: 9
I10-index: 9
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