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Keigo Nagao
Observed names:
K Nagao,
K. Nagao,
Keigo NAGAO,
Nagao, K.
Institution:
Rigaku (Japan)
Observed institutions:
Yamaguchi University,
Rigaku (Japan),
National Institute of Advanced Industrial Science and Technology,
Ube (Japan)
OpenAlex ID:
A5110146685
Influence of metal electrodes on crystal orientation of aluminum nitride thin films
2004
·
Morito Akiyama
, Keigo Nagao
, et al.
·
Vacuum
·
88
Preparation of highly oriented aluminum nitride thin films on molybdenum bottom electrodes using metal interlayers
2005
·
M. Akiyama
, N. Ueno
, et al.
·
Journal of Materials Science
·
19
Reduction Behavior of Surface Oxide on Submicron Copper Particles for Pressureless Sintering Under Reducing Atmosphere
2021
·
Tomoki Matsuda
, Daiki Yamagiwa
, et al.
·
Journal of Electronic Materials
·
11
Preparation and properties of Lanthanum lead zirconate titanate thin films by hydrothermal method
1996
·
Takafumi Kawano
, Keigo Nagao
, et al.
·
Integrated ferroelectrics
·
11
Single crystal X-ray structure determination and temperature-dependent structural studies of the smectogenic compound 7OS5
2020
·
Aleksandra Deptuch
, Teresa Jaworska-Gołąb
, et al.
·
Acta Crystallographica Section B Structural Science Crystal Engineering and Materials
·
6
Characterization of FexSiO (0
1991
·
Kakuei Matsubara
, Koh'ichi Kawamura
, et al.
·
Japanese Journal of Applied Physics
·
6
PDF
Growth of highly c-axis oriented aluminum nitride thin films on β-tantalum bottom electrodes
2006
·
M. Akiyama
, N. Ueno
, et al.
·
Journal of Materials Science
·
5
Physical properties of 8OS5 thioester studied by complementary methods
2017
·
Aleksandra Deptuch
, Teresa Jaworska-Gołąb
, et al.
·
Phase Transitions
·
4
Pole Figure and Residual Stress Measurement of Thin Film Materials by X-Ray Diffraction Method Using a Two-Dimensional Detector
2015
·
Keigo NAGAO
·
Journal of The Surface Finishing Society of Japan
·
3
PDF
Microstructure control of β-FeSi2 ceramics by rf-plasma processing in SiH4 and GeH4 gases
1994
·
K. Kishimoto
, Y. Nagamoto
, et al.
·
AIP conference proceedings
·
3
Electronic structure of β-FeSi2 modified by r.f.-plasma of semiconducting SiH4, GeH4 gas
2001
·
K Matsubara
, K Nagao
, et al.
·
Thin Solid Films
·
2
CCDC 1960049: Experimental Crystal Structure Determination
2020
·
Deptuch, A.
, Jaworska-Gołąb, T.
, et al.
·
The Cambridge Structural Database
Methods of Measurement and Evaluation of Texture （1）X-ray Diffraction
2013
·
Yoshiyuki YAMADA
, Keigo NAGAO
·
Journal of the Japan Society for Technology of Plasticity
X-ray measurement of residual stress and texture in the welded section and its neighbour
2011
·
Yoshiyuki Yamada
, Keigo Nagao
·
Welding International
The Recent Progress of X-ray Diffractometer
2008
·
Keigo NAGAO
·
Journal of The Adhesion Society of Japan
PDF
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Works count:
15
Citation count:
158
H-index:
6
I10-index:
4
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