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Faysal Boughorbel

Observed names: Boughorbel Faysal, Boughorbel, Faysal, F. Boughorbel
ORCID: 0009-0001-9748-5862
Observed ORCID: 0009-0001-9748-5862
OpenAlex ID: A5110286901
Multiscale Fusion of Visible and Thermal IR Images for Illumination-Invariant Face Recognition
2006 · Seong G. Kong, Jingu Heo, et al. · International Journal of Computer Vision · 218
Digital reality: a model-based approach to supervised learning from synthetic data
2019 · Tim Dahmen, Patrick Trampert, et al. · AI Perspectives · 43
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Deep Neural Networks for Analysis of Microscopy Images—Synthetic Data Generation and Adaptive Sampling
2021 · Patrick Trampert, Dmitri Rubinstein, et al. · Crystals · 41
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3D multi-energy deconvolution electron microscopy
2016 · Michiel de Goede, Eric Johlin, et al. · Nanoscale · 31
A new method for the registration of three-dimensional point-sets: The Gaussian Fields framework
2009 · Faysal Boughorbel, Muharrem Mercimek, et al. · Image and Vision Computing · 31
Gaussian fields: a new criterion for 3D rigid registration
2004 · Faysal Boughorbel, Andreas Koschan, et al. · Pattern Recognition · 28
Laser ranging and video imaging for bin picking
2003 · Faysal Boughorbel, Yan Zhang, et al. · Assembly Automation · 26
A New Method for Automatic 3D Face Registration
2006 · V.R. Ayyagari, F. Boughorbel, et al. · 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops · 20
High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing
2017 · Faysal Boughorbel, Pavel Potocek, et al. · Microscopy and Microanalysis · 10
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Bringing Deconvolution Algorithmic Techniques to the Electron Microscope
2013 · Ben Lich, Xiaodong Zhuge, et al. · Biophysical Journal · 9
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SEM 3D Reconstruction of Stained Bulk Samples using Landing Energy Variation and Deconvolution
2012 · F. Boughorbel, X. Zhuge, et al. · Microscopy and Microanalysis · 9
Adaptive filters for depth from stereo and occlusion detection
2008 · Faysal Boughorbel · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Automatic registration of 3D datasets using Gaussian fields
2005 · F. Boughorbel, A. Koschan, et al. · Proceedings - International Conference on Image Processing · 3
Gaussian energy functions for registration without correspondences
2004 · F. Boughorbel, A. Koschan, et al. · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · 3
Estimating 3D camera motion without correspondences using a search for the best structure
2002 · Faysal Boughorbel, Paul Crilly, et al. · Pattern Recognition Letters · 3
The Future SEM Sees 3 Dimensions... Bringing Deconvolution Techniques to the Electron Microscope.
2013 · F. Boughorbel, X. Zhuge, et al. · Microscopy and Microanalysis · 2
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Automatic 3D Face Registration Without Initialization
2007 · A. Koschan, V. R. Ayyagari, et al. · Springer eBooks · 2
A New Multiple-Windows Depth from Stereo Algorithm for 3D Displays
2007 · Faysal Boughorbel · 2
A new multi-sensor registration technique for three-dimensional scene modeling with application to unmanned vehicle mobility enhancement
2005 · Faysal Boughorbel, Andreas Koschan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
A Pose Invariant 3D Face Recognition Method
2005 · Venkat Rao Ayyagari, Faysal Boughorbel, et al. · 2
Multi-sensor Registration and Integration for Inspection and Navigation
2004 · Faysal Boughorbel, Andreas Koschan, et al. · 2
A Methodology to Optimize Laser Dicing Parameters to Maximize Dicing Quality Through Machine Learning
2023 · Sathya Raghavan, Aakrati Jain, et al. · 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) · 1
Charged particle microscopy imaging method (US 8,581,189)
2013 · Faysal Boughorbel, Eric Bosch, et al. · 1
SEM imaging method (US 8,232,523)
2012 · Faysal Boughorbel, C. S. Kooijman, et al. · 1
AOI-SSL: Self-Supervised Framework for Efficient Segmentation of Wire-bonded Semiconductors In Optical Inspection
2026 · Figueira, Joaquín, Van Gastel, Rob, et al. · arXiv (Cornell University)
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Works count: 48
Citation count: 494
H-index: 9
I10-index: 9
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