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Dave K. K. Nelson
Observed names:
D. K. Nelson,
D. Nelson,
D.K. Nelson,
Dave Nelson
Institutions:
IBM (United States),
Honeywell (United States)
Observed institutions:
IBM (United States),
University of Louisville,
Lawrence Berkeley National Laboratory,
RCA (United States),
Honeywell (United States),
University of California, Berkeley
show all 6
OpenAlex ID:
A5110350022
Implementation of the CELL Broadband Engine in a 65nm SOI Technology Featuring Dual-Supply SRAM Arrays Supporting 6GHz at 1.3V
2007
·
J. Pille
, C. Adams
, et al.
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
48
Applications of a first-generation current conveyor in current-mode circuits
1990
·
P. Aronhime
, D. Nelson
, et al.
·
Electronics Letters
·
34
Field enhancement of a 12.5-T magnet using holmium poles
1985
·
R. Hoard
, S. Mance
, et al.
·
IEEE Transactions on Magnetics
·
24
Limiting Upset Cross Sections of SEU Hardened SOI SRAMs
2006
·
Michael S. Liu
, Harry Y. Liu
, et al.
·
IEEE Transactions on Nuclear Science
·
18
Realization of current-mode complex pole all-pass networks using a single current conveyor
2002
·
P. Aronhime
, D. Nelson
, et al.
·
IEEE International Symposium on Circuits and Systems proceedings
·
16
Tunnel-diode microwave oscillators with milliwatt power outputs
2005
·
D. Nelson
, F. Sterzer
·
WESCON Conference Record
·
9
Proton induced single event upset in a 4M SOI SRAM
2003
·
H. Y. Liu
, S.T. Liu
, et al.
·
8
The Effect of Active Delay Element Resistance on Limiting Heavy Ion SEU Upset Cross-Sections of SOI ADE/SRAMs
2007
·
S. T. Liu
, D. K. Nelson
, et al.
·
IEEE Transactions on Nuclear Science
·
6
Asymmetric SEU in SOI SRAMs
2005
·
P.J. McMarr
, M.E. Nelson
, et al.
·
IEEE Transactions on Nuclear Science
·
3
Single event effects hardening and characterization of Honeywell's RHPPC integrated circuit
2004
·
J.P. Lintz
, L.F. Hoffmann
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
2
Heavy Ion Induced Upset Cross-Sections of 150nm SOI CMOS SRAMs Fabricated in UNIBOND
2007
·
Michael S. Liu
, Dave K. K. Nelson
, et al.
·
ECS Transactions
·
1
PDF
Design, fabrication, and calibration of curved integral coils for measuring transfer function, uniformity and effective length of LBL ALS booster dipole magnets
2003
·
M.I. Green
, D. Nelson
, et al.
·
Particle Accelerator Conference (PAC)
·
1
161. Theoretical Error Reduction from Iterative Risk Assessment
1999
·
D. Nelson
·
AIHce 1997 - Taking Responsibility...Building Tomorrow's Profession Papers
·
1
Magnetic measurements at Lawrence Berkeley Laboratory
1992
·
M.I. Green
, P. Barale
, et al.
·
IEEE Transactions on Magnetics
·
1
PDF
Heavy Ion Upsets in 150nm SOI CMOS SRAMs Fabricated in UNIBOND
2007
·
Michael S. Liu
, Dave K. K. Nelson
, et al.
·
ECS Meeting Abstracts
PDF
150nm SOI Embedded SRAMs With Very Low SER
2006
·
D.K. Nelson
, H. Liu
, et al.
·
IEEE International SOI Conference (SOI)
Design, fabrication, and calibration of curved integral coils for measuring transfer function, uniformity, and effective length of LBL ALS (Lawrence Berkeley Laboratory Advanced Light Source) Booster Dipole Magnets
1989
·
M.I. Green
, D. Nelson
, et al.
·
University of North Texas Digital Library (University of North Texas)
PDF
Design, Fabrication, and Calibration of Curved Integral Coils for Measuring Transfer Function, Uniformity and Effective Length of LBL ALS Booster Dipole Magnets
1989
·
M. I. Green
, B. Gee
, et al.
·
pac
Bevalac Third Injector Ion Source Magnet Drawing No. 19p3146, Magnetic Measurements.
1980
·
D. Nelson
, R. Thatcher
·
eScholarship (California Digital Library)
PDF
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Works count:
19
Citation count:
172
H-index:
7
I10-index:
5
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