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Joseph H. Bunton
Observed names:
J H Bunton,
J. H. Bunton,
J.H. Bunton,
JH Bunton,
Joseph Bunton,
Joseph H Bunton
show all 6
Institution:
Cameca (United States)
Observed institution:
Cameca (United States)
OpenAlex ID:
A5110630530
Atom Probe Tomography of Electronic Materials
2007
·
Thomas F. Kelly
, David J. Larson
, et al.
·
Annual Review of Materials Research
·
226
First Data from a Commercial Local Electrode Atom Probe (LEAP)
2004
·
Thomas F. Kelly
, Tye T. Gribb
, et al.
·
Microscopy and Microanalysis
·
191
Advances in Pulsed-Laser Atom Probe: Instrument and Specimen Design for Optimum Performance
2007
·
Joseph H. Bunton
, Jesse D. Olson
, et al.
·
Microscopy and Microanalysis
·
177
Laser pulsing of field evaporation in atom probe tomography
2013
·
Thomas F. Kelly
, Angela Vella
, et al.
·
Current Opinion in Solid State and Materials Science
·
88
Analysis of Bulk Dielectrics with Atom Probe Tomography
2008
·
DJ Larson
, RL Alvis
, et al.
·
Microscopy and Microanalysis
·
56
Intermixing and phase separation at the atomic scale in Co-rich (Co,Fe) and Cu multilayered nanostructures
2005
·
Peter F. Ladwig
, Jesse D. Olson
, et al.
·
Applied Physics Letters
·
10
Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry
2018
·
David J. Larson
, Robert M. Ulfig
, et al.
·
JOM
·
9
PDF
The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes
2021
·
Jonathan Op de Beeck
, Jeroen E Scheerder
, et al.
·
Microscopy and Microanalysis
·
8
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra
2024
·
Benjamin W. Caplins
, Ann N. Chiaramonti
, et al.
·
Ultramicroscopy
·
6
Using Ma ss Resolving Power as a Performance Metric in the Atom Probe
2016
·
Fred Meisenkothen
, Thomas F. Kelly
, et al.
·
Microscopy and Microanalysis
·
5
PDF
New Product Announcement – LEAP 6000XR, New Applications, New Performance
2022
·
Robert Ulfig
, Daniel Lenz
, et al.
·
Microscopy and Microanalysis
·
4
First Data from a Commercial Local Electrode Atom Probe
2002
·
T. T. Gribb
, J. D. Olson
, et al.
·
Microscopy and Microanalysis
·
4
PDF
Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
2017
·
Robert M. Ulfig
, Ty J. Prosa
, et al.
·
Microscopy and Microanalysis
·
3
PDF
Atom Probe Tomography with the Easier to Operate EIKOS™
2017
·
Katherine P. Rice
, Yimeng Chen
, et al.
·
Microscopy and Microanalysis
·
3
PDF
Reconstruction Metrics in Atom Probe Tomography
2019
·
BP Geiser
, DA Reinhard
, et al.
·
Microscopy and Microanalysis
·
2
PDF
Investigation of Performance-Influencing Factors in Pulsed Laser Atom Probe
2008
·
JH Bunton
, JD Olson
, et al.
·
Microscopy and Microanalysis
·
2
Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
2006
·
K Thompson
, DJ Larson
, et al.
·
Microscopy and Microanalysis
·
2
PDF
Thermal Stability of Co-Fe and Cu Multilayered Thin Films
2003
·
Peter F. Ladwig
, Jesse D. Olson
, et al.
·
Microscopy and Microanalysis
·
2
PDF
New Product Announcement – Invizo 6000, New Applications, New Performance
2022
·
David A Reinhard
, Daniel Lenz
, et al.
·
Microscopy and Microanalysis
·
1
Arsenic Segregation to Dislocation Loops in Silicon
2008
·
DJ Larson
, K Thompson
, et al.
·
Microscopy and Microanalysis
·
1
A Reconstruction Wizard for Electrostatic Reconstruction
2022
·
Brian P Geiser
, David Reinhard
, et al.
·
Microscopy and Microanalysis
Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS)
2019
·
Robert M. Ulfig
, Joseph Bunton
, et al.
·
Microscopy and Microanalysis
PDF
Counter Electrode Design Considerations in Atom Probe Tomography Microscopes
2016
·
Robert Ulfig
, Dan Lenz
, et al.
·
European Microscopy Congress 2016: Proceedings
PDF
Three-Dimensional Compositional Analysis of SiGe Structures with a Laser Assisted Local Electrode Atom Probe
2006
·
K. Thompson
, D.J. Larson
, et al.
·
2006 International SiGe Technology and Device Meeting
Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
2006
·
Keith Thompson
, David Larson
, et al.
·
ECS Meeting Abstracts
PDF
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Works count:
27
Citation count:
800
H-index:
8
I10-index:
6
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