Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Narendraraj Chandran
Observed names:
Chandran Narendraraj,
N. Chandran
Institution:
Tescan (Czechia)
Observed institutions:
Tescan (Czechia),
Aristotle University of Thessaloniki,
Indian Institute of Science Bangalore
OpenAlex ID:
A5110725591
Synergistic enhancement of photocatalytic CO2 reduction by plasmonic Au nanoparticles on TiO2 decorated N-graphene heterostructure catalyst for high selectivity methane production
2022
·
Khaja Mohaideen Kamal
, Rekha Narayan
, et al.
·
Applied Catalysis B: Environmental
·
120
PDF
Highly efficient nickel-niobia composite catalysts for hydrogenation of CO2 to methane
2018
·
Edwin S. Gnanakumar
, Narendraraj Chandran
, et al.
·
Chemical Engineering Science
·
71
PDF
Template Matching Approach for Automated Determination of Crystal Phase and Orientation of Grains in 4D-STEM Precession Electron Diffraction Data for Hafnium Zirconium Oxide Ferroelectric Thin Films
2025
·
Alain C Diebold
, Colin Ophus
, et al.
·
Microscopy and Microanalysis
·
24
PDF
Novel bainitic Ti alloys designed for additive manufacturing
2024
·
Ryan Brooke
, Duyao Zhang
, et al.
·
Materials & Design
·
23
Phosphazene-Based Covalent Organic Polymer Decorated with NiCo2O4 Nanocuboids as a Trifunctional Electrocatalyst: A Unique Replacement for the Conventional Electrocatalysts
2021
·
Pandiaraj Sekar
, Nithya Murugesh
, et al.
·
ACS Applied Energy Materials
·
23
The role of the Ti and Mo barrier layer in Ti/Al metallization to AlGaN/GaN heterostructures at identical process conditions: a structural and chemical characterization
2015
·
Narendraraj Chandran
, Lilyana Kolakieva
, et al.
·
Semiconductor Science and Technology
·
4
On the Formation of Graphene by Ge Intercalation of a 4H-SiC Surface
2015
·
N. Chandran
, Mamour Sall
, et al.
·
Materials science forum
·
2
TEM Characterization of a Complex Twinning System in 3C–SiC
2015
·
Mamour Sall
, Narendraraj Chandran
, et al.
·
Springer proceedings in physics
·
1
Interface structure characterization depending on the barrier film in TiAl-based metallizations to AlGaN/GaN heterostructures
2014
·
L. Kolaklieva
, N. Chandran
, et al.
·
IEEE International Conference on Microelectronics (MIEL)
·
1
Advancing Quantitative Failure Analysis and Strain Measurements at the Nanoscale by Using Scanning Electron Diffraction Microscopy Enhanced by Beam Precession
2024
·
Tomáš Morávek
, Eduardo Serralta
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Precession-Assisted 4D-STEM Strain Characterization of Semiconductor Devices
2024
·
Eduardo Serralta
, Tomáš Moravek
, et al.
·
Microscopy and Microanalysis
Adding Another Dimension to 4D-STEM with EDX-assisted Crystal Orientation and Phase Mapping
2023
·
Robert Hooley
, Tomáš Morávek
, et al.
·
Microscopy and Microanalysis
Optimisation of Large Chunk Lift-Out Method and Lamella Preparation for CBED mEasurements Using Xenon Plasma FIB
2019
·
Miloš Hrabovský
, Tomáš Morávek
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Correction of Stress Release During Sample Preparation for TEM CBED Measurements
2018
·
Jürgen Gluch
, Martin Gall
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Microstructural Characterization of 3C-SiC Layers, Grown Epitaxially on 4H-SiC Substrates by CVD
2015
·
Efstathios K. Polychroniadis
, Mamour Sall
, et al.
·
Advanced materials research
Micro and Nano Structural Characterization of SiC
2014
·
Narendraraj Chandran
, Ariadne Andreadou
, et al.
·
Springer proceedings in physics
On the nanoscaled defects of 3C-SiC
2014
·
A. Mantzari
, A. Andreadou
, et al.
·
International Journal of Nanotechnology
Show more works
View as search
Works count:
17
Citation count:
269
H-index:
5
I10-index:
5
Year
Topic
Type
