Author

Zimo Zhou

Institution: Fudan University

Observed institution: Fudan University

ORCID: 0009-0004-9290-306X

Observed ORCID: 0009-0004-9290-306X

OpenAlex ID: A5111079847

Unveiling the interfacial nanostructure and electrical mechanism of low-resistivity Cr/Au ohmic contacts formed on β-Ga2O3 via laser annealing

2025 · Xin Qi, Man Luo, et al. · Applied Surface Science · 4

Effects of pre-deposited ultra-thin Al2O3 interlayer and post-annealing on SiO2/4H-SiC MOS capacitors

2025 · Chengxi Ding, Man Luo, et al. · Applied Surface Science · 3

Advances and Perspectives in Gate Dielectric Thin Films for 4H-SiC MOSFETs

2026 · Zhaopeng Bai, Jinsong Liang, et al. · Materials · 2

Impact of BN Buffer Layer Thickness on Interfacial Structure and Band Alignment of a-BN/4H-SiC Heterojunctions

2025 · Yang-Chao Liu, Wen-Jie Chen, et al. · Coatings · 2

SiC-based AlN buffer layer and band alignment in Ga2O3/AlN/SiC heterojunctions

2026 · Zimo Zhou, Yi Shen, et al. · Journal of Alloys and Compounds · 1

Improvement of Physical and Electrical Characteristics in 4H-SiC MOS Capacitors Using AlON Thin Films Fabricated via Plasma-Enhanced Atomic Layer Deposition

2025 · Zhaopeng Bai, Chengxi Ding, et al. · Materials · 1

Effects of the Al–O–Si interfacial layers on Al2O3/SiC MOS capacitors

2026 · Chengxi Ding, Yuan Tian, et al. · Applied Surface Science

Works count: 7

Citation count: 13

H-index: 2

I10-index: