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Author

Chris H Schwalb

Observed names: Chris Schwalb, Schwalb, Chris
Observed institution: Quantum Design (Germany)
OpenAlex ID: A5111269471
A New Correlative Microscopy Platform Integrating AFM with in situ SEM
2023 · Kerim Arat, Hamed Alemansour, et al. · Microscopy and Microanalysis · 5
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Nondestructive Mechanical and Electrical Characterization of Piezoelectric Zinc Oxide Nanowires for Energy Harvesting
2025 · Frank Eric Boye Anang, Markys Cain, et al. · Micromachines · 4
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In Situ AFM-SEM-EDS, a Correlative Microscopy Platform for Surface Characterization and Elemental Analysis
2024 · Kerim T Arat, Jost H Diederichs, et al. · Microscopy and Microanalysis · 4
A Novel Tool for Combined AFM, SEM, and Electrical Probing of Nanostructures
2024 · Chris Schwalb, Hajo Frerichs, et al. · BIO Web of Conferences · 1
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Works count: 6
Citation count: 14
H-index: 3
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