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Dharmendra Kumar Singh

Observed name: Kumar Singh, Dharmendra
ORCID: 0009-0005-7925-6213
Observed ORCID: 0009-0005-7925-6213
OpenAlex ID: A5111272071
Thermally Activated Fail Bit Counts of Single and Multi-Level NAND flash Memory
2024 · Dharmendra Kumar Singh, Arjun Shetty, et al. · Conference digest · 3
FPGA-NAND Flash Reliability Measurement System to Probe Layer-Dependent Neurocomputing Efficiency
2026 · Asifa Khatun, Himanshu Marothya, et al. · IEEE International Reliability Physics Symposium proceedings
FPGA-Based NAND Flash Reliability Measurement System to Probe Layer-Dependent Neurocomputing Efficiency
2026 · IEEE International Symposium on Reliability Physics 2026, khatun, asifa, et al. · Underline Science Inc.
Temperature Coefficient of Read Reference Voltage in NAND Flash Memory Under Thermal Stress
2025 · Dharmendra Kumar Singh, Siva Chittiboina, et al. · IEEE International Conference on Emerging Electronics (ICEE)
Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory
2025 · Dharmendra Kumar Singh, Himanshu Marothya, et al. · IEEE Transactions on Device and Materials Reliability
Reliability Correlation Coefficient of Fail Bit Counts of Flash Memory
2025 · Dharmendra Kumar Singh, Himanshu Marothya, et al. · IEEE Transactions on Device and Materials Reliability
Works count: 6
Citation count: 3
H-index: 1
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