Author

S-W. Tam

Institution: NXP (Germany)

Observed institution: NXP (Germany)

OpenAlex ID: A5111301764

Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology

2024 · T. V. Dinh, S-W. Tam, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 4

Works count: 1

Citation count: 4

H-index: 1

I10-index: