Author

PJJ Kamp

Observed names: P. Van Der Kamp, Pieter van der Kamp, Van Der Kamp, Pieter, van der Kamp, Pieter
Observed institution: VSL National Metrology Institute
ORCID: 0009-0003-5560-2404
Observed ORCID: 0009-0003-5560-2404
OpenAlex ID: A5111308005
2006 · James R. Neale, Michael R.W. Walmsley, et al. · Chemeca 2006: Knowledge and Innovation · 4
2024 · E. Houtzager, P. Van Der Kamp, et al. · Conference on Precision Electromagnetic Measurements · 1
2026 · Tycho van Leersum, Pieter van der Kamp, et al. · Conference on Precision Electromagnetic Measurements
2026 · Ernest Houtzager, Pieter van der Kamp, et al. · IEEE Transactions on Instrumentation and Measurement
2026 · Ana M. Fuentes-Herrera, Miguel Ángel Olivan, et al. · IEEE Transactions on Instrumentation and Measurement
2025 · Ana Milagros Fuentes Herrera, Miguel Angel Olivan, et al. · IEEE International Workshop on Applied Measurements for Power Systems (AMPS)
2021 · Van Der Kamp, Pieter, McLaren, David, et al. · La Trobe University
2006 · Jonas Hoffmann-Vocke, Neale, et al. · Chemeca 2006: Knowledge and Innovation
2006 · A. W. Morrison, Michael R.W. Walmsley, et al. · Chemeca 2006: Knowledge and Innovation
Works count: 11
Citation count: 5
H-index: 1
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