Author

Koichi Akimoto

Observed names: KOICHI AKIMOTO, Koichi AKIMOTO, Koichi. Akimoto, 晃一秋本

Observed institutions: NEC (Japan), Japan Women's University, The Institute for Solid State Physics, The University of Tokyo, Nagoya University, The University of Tokyo

OpenAlex ID: A5111794596

SiO2 / Si Interface Structures and Reliability Characteristics

1995 · Eiji Hasegawa, Akihiko Ishitani, et al. · Journal of The Electrochemical Society · 98

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Structural Analysis of the NiSi2/(111)Si Interface by the X-Ray Standing-Wave Method

1985 · Koichi Akimoto, Tetsuya Ishikawa, et al. · Japanese Journal of Applied Physics · 46

Structure Analysis of the NiSi2/(111)Si Interface by the X-Ray Standing Wave Method

1983 · Koichi Akimoto, Tetsuya Ishikawa, et al. · Japanese Journal of Applied Physics · 39

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Structure analysis of the NiSi2/(111)Si interface by the X-ray standing wave method

1986 · Koichi Akimoto, Tetsuya Ishikawa, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 30

Interfacial Superstructure of AlN/n-GaAs(001) System Fabricated by Metalorganic Chemical Vapor Deposition

1988 · Koichi Akimoto, Ichiro Hirosawa, et al. · Japanese Journal of Applied Physics · 29

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Synchrotron Plane Wave X-Ray Topography of 6 inch Diameter Si Crystal

1987 · Tomohisa Kitano, Tetsuya Ishikawa, et al. · Japanese Journal of Applied Physics · 26

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Structure of (√3×√3) R 30°-B at the Si interface studied by grazing incidence x-ray diffraction

1990 · Koichi Akimoto, Ichiro Hirosawa, et al. · Applied Physics Letters · 22

Structure of the quasi-one-dimensional Si(553)-Au surface: Gold dimer row and silicon honeycomb chain

2010 · Wolfgang Voegeli, Toru Takayama, et al. · Physical Review B · 21

Quantitative evaluation of strain near reconstructed Si surfaces

2001 · Takashi Emoto, Koichi Akimoto, et al. · Surface Science · 15

Interface Structure and Preferred Orientation of Ag/Si(111) Revealed by X-Ray Diffraction

1998 · Koichi Akimoto, Melania Lijadi, et al. · Surface Review and Letters · 15

Observation of the strain field near the Si(111) 7 × 7 surface with a new X-ray diffraction technique

1998 · Takashi Emoto, Koichi Akimoto, et al. · Journal of Synchrotron Radiation · 13

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SiO2/Si interface study with synchroton radiation X-ray diffraction

1990 · Ichiro Hirosawa, Koichi Akimoto, et al. · Journal of Crystal Growth · 13

X-Ray Diffraction Study of the Phase Transition of the ${\rm Si}(111)(\sqrt{3} \times \sqrt{3})\mbox{-Ag}$ Surface

2003 · Toshio Takahashi, Hiroo Tajiri, et al. · Surface Review and Letters · 11

Control of the Electrical Properties of AlN/thin-a-Si/GaAs MIS Diodes by GaAs Surface Pretreatments

1990 · Shinji Fujieda, Yasunori Mochizuki, et al. · Japanese Journal of Applied Physics · 10

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Structure of the oxidized 4H–SiC(0 0 0 1)-3 × 3 surface

2006 · Wolfgang Voegeli, Koichi Akimoto, et al. · Surface Science · 9

Surface X-ray Diffraction Study of the Metal-Insulator Transition on the Si(553)-Au Surface

2008 · Wolfgang Voegeli, Toru Takayama, et al. · e-Journal of Surface Science and Nanotechnology · 7

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Study of the surface structure of Si(1 1 1)-6 × 1(3 × 1)-Ag using X-ray crystal truncation rod scattering

2006 · Kazushi Sumitani, Kosuke Masuzawa, et al. · Applied Surface Science · 6

Silicon Surface Imperfection Probed with a Novel X-Ray Diffraction Technique and Its Influence on the Reliability of Thermally Grown Silicon Oxide

1993 · Tomohisa Kitano, Eiji Hasegawa, et al. · Japanese Journal of Applied Physics · 6

X-Ray Standing Wave Method Applied to the Characterization of InGaAsP Alloy Semiconductor Thin Film

1985 · Koichi Akimoto, Tetsuya Ishikawa, et al. · Japanese Journal of Applied Physics · 6

Crystal orientation changes of Ag thin films on the Si(111) substrate due to tribo-assisted recrystallization

2006 · Koichi Akimoto, Koji Fukagawa, et al. · Thin Solid Films · 5

Effects of InP Surface Treatment on the Electrical Properties and Structures of AlN/n-InP Interface

1989 · Shinji Fujieda, Koichi Akimoto, et al. · Japanese Journal of Applied Physics · 5

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Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction

2010 · Koichi Akimoto, Takashi Emoto · Journal of Physics Condensed Matter · 4

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Surface and Interface Strains Revealed by X-ray Diffraction

1999 · KOICHI AKIMOTO, TAKASHI EMOTO, et al. · Surface Review and Letters · 4

Study of buried Si(111)-5×2-Au by surface X-ray diffraction

2008 · Yusaku Iwasawa, Wolfgang Voegeli, et al. · Applied Surface Science · 3

Increased thermal stability due to addition of Ge in B/Si(111) heterostructures

1996 · Douglas J. Tweet, Koichi Akimoto · Physica B Condensed Matter · 3

Works count: 101

Citation count: 464

H-index: 12

I10-index: 14