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Fook Yen Chai

Observed name: F. Chai
ORCID: 0009-0001-1731-1003
Observed ORCID: 0009-0001-1731-1003
OpenAlex ID: A5111826139
Charge separation for bipolar transistors
1993 · S.L. Kosier, R.D. Schrimpf, et al. · IEEE Transactions on Nuclear Science · 206
Optimization of a SiGe:C HBT in a BiCMOS technology for low power wireless applications
2003 · J.P. John, F. Chai, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 27
The Emergence of SiGe:C HBT Technology for RF Applications
2003 · V. Ilderem, Selin Tolunay Wipf, et al. · 4
Traps in 4H-SiC Field-Effect Transistors Characterized by Capacitance- and Current-Mode Deep-Level Transient Spectroscopy
2011 · Z.-Q. Fang, B. Claflin, et al. · Journal of Electronic Materials · 2
Reduction of Defects with Single Piece Upper Electrode (SPUE) in Oxide Etch Applications
2023 · Fook Yen Chai, Pui Hoon Tan, et al. · ASMC proceedings · 1
Lifetime Extension for Oxide Etch Application with Silicon Carbide Focus Ring
2025 · KelvinYi Boon Tan, Vivian Wen Xin Siew, et al. · ASMC proceedings
Wafer Edge RF LNR Yield Improvement in Oxide Etch Applications
2024 · Fook Yen Chai, Li Bo, et al. · ASMC proceedings
Works count: 7
Citation count: 240
H-index: 3
I10-index: 2
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