Author

C.‐G. Oertel

Observed names: C-G Oertel, C. G. Oertel, C.-G Oertel, C.-G. Oertel, C.G. Oertel
Observed institution: Technische Universität Dresden
OpenAlex ID: A5111948537
2007 · W. Skrotzki, N. Scheerbaum, et al. · Acta Materialia · 96
2010 · B. Beausir, J. Scharnweber, et al. · Materials Science and Engineering A · 59
2010 · C.-G. Oertel, I. Hünsche, et al. · International Journal of Refractory Metals and Hard Materials · 57
2010 · R. Chulist, W. Skrotzki, et al. · Scripta Materialia · 52
2013 · I.V. Okulov, S. Pauly, et al. · Materials Science and Engineering C · 47
2015 · G.H. Cao, A.M. Russell, et al. · Acta Materialia · 46
2007 · C.-G. Oertel, I. Huensche, et al. · Materials Science and Engineering A · 43
2020 · B. Gu, P. Chekhonin, et al. · Journal of Alloys and Compounds · 42
2010 · R. Chulist, W. Skrotzki, et al. · Scripta Materialia · 33
2012 · R. Chulist, A. Sozinov, et al. · Journal of Applied Physics · 29
2010 · B Adolphi, J McCord, et al. · Smart Materials and Structures · 29
2014 · I.V. Okulov, U. Kühn, et al. · Materials Science and Engineering A · 28
2003 · W. Skrotzki, B. Klöden, et al. · Texture Stress and Microstructure · 28
2005 · A. Singh, R. Tamm, et al. · Journal of Applied Physics · 27
2012 · R. Chulist, E. Pagounis, et al. · Scripta Materialia · 24
2006 · Werner Skrotzki, N. Scheerbaum, et al. · Materials science forum · 23
2014 · I. V. Okulov, U. Kühn, et al. · Applied Physics Letters · 22
2013 · G. H. Cao, R. Schneider, et al. · Applied Physics Letters · 22
2005 · Werner Skrotzki, N. Scheerbaum, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 20
2008 · Werner Skrotzki, Ingwar Hünsche, et al. · Texture Stress and Microstructure · 18
2004 · W. Skrotzki, K. Kegler, et al. · Crystal Research and Technology · 18
2004 · I. Hünsche, C.G. Oertel, et al. · Materials science forum · 18
Works count: 98
Citation count: 1,179
H-index: 20
I10-index: 38
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