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Siang-Ning Tseng
Observed names:
S. Tseng,
S.F.C. Tseng
Institution:
National Pingtung University of Science and Technology
Observed institutions:
National Pingtung University of Science and Technology,
Shanghai Jiao Tong University,
Semiconductor Manufacturing International (China)
ORCID:
0009-0001-9372-087X
Observed ORCID:
0009-0001-9372-087X
OpenAlex ID:
A5111952164
Stress migration related reliability concerns
2005
·
J.J.Y. Ma
, S.F.C. Tseng
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
5
Self-powered DUV photodetector harvesting piezoelectric energy in a Ga₂O₃/ZnO nanorod heterojunction
2025
·
Kai-Lin Yang
, Liang-Wen Ji
, et al.
·
Chemical Engineering Journal Advances
·
4
Fast WLRC applications in foundry fabrication
2005
·
S. Tseng
, W.T.K. Chien
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
An innovative multi-via test structure for wafer-level isothermal electromigration
2005
·
S.F.C. Tseng
, Wei-Ting Kary Chien
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
1
Interfacial Polarization and Surface Morphological Modulation in Porous GO/PDMS Composites for Enhanced Triboelectric Charge Density
2026
·
Liang-Wen Ji
, Kai-Lin Yang
, et al.
·
SSRN Electronic Journal
Self-Powered Duv Photodetector Harvesting Piezoelectric Energy in a Ga₂O₃/Zno Nanorod Heterojunction
2025
·
Liang-Wen Ji
, Kai-Lin Yang
, et al.
·
SSRN Electronic Journal
Improvement of spacer particle induced reliability failures
2005
·
S. Tseng
, K. Chien
, et al.
·
IEEE International Integrated Reliability Workshop final report
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Works count:
7
Citation count:
12
H-index:
2
I10-index:
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