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Myung Soo Huh

Observed names: Myung-Soo Huh, Myungsoo Huh
ORCID: 0009-0008-2206-8766
Observed ORCID: 0009-0008-2206-8766
OpenAlex ID: A5112082367
High-Quality Low-Temperature Silicon Oxide by Plasma-Enhanced Atomic Layer Deposition Using a Metal–Organic Silicon Precursor and Oxygen Radical
2010 · Seok-Jun Won, Sungin Suh, et al. · IEEE Electron Device Letters · 77
Role of ZrO2 incorporation in the suppression of negative bias illumination-induced instability in Zn–Sn–O thin film transistors
2011 · Bong Seob Yang, Myung Soo Huh, et al. · Applied Physics Letters · 68
Improvement of electrical and optical properties of molybdenum oxide thin films by ultralow pressure sputtering method
2012 · Myeong Sook Oh, Bong Seob Yang, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 35
Improving the Morphological and Optical Properties of Sputtered Indium Tin Oxide Thin Films by Adopting Ultralow-Pressure Sputtering
2008 · Myung Soo Huh, Bong Seop Yang, et al. · Journal of The Electrochemical Society · 26
Improvement in the Performance of Tin Oxide Thin-Film Transistors by Alumina Doping
2009 · Myung Soo Huh, Bong Seop Yang, et al. · Electrochemical and Solid-State Letters · 22
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Capacitance and Interface Analysis of Transparent Analog Capacitor Using Indium Tin Oxide Electrodes and High-k Dielectrics
2010 · Seok-Jun Won, Myung Soo Huh, et al. · Journal of The Electrochemical Society · 15
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Improved electrical properties of tin-oxide films by using ultralow-pressure sputtering process
2009 · Myung Soo Huh, Bong Seop Yang, et al. · Thin Solid Films · 12
Improving the Performance of Tin Oxide Thin-Film Transistors by Using Ultralow Pressure Sputtering
2010 · Myung Soo Huh, Bong Seob Yang, et al. · Journal of The Electrochemical Society · 10
Folding stabilities of encapsulation layers at positions off the mechanical neutral plane
2018 · Haksoo Lee, Jintaek Han, et al. · Applied Physics Express · 8
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Sidewall patterning of organic–inorganic multilayer thin film encapsulation by adhesion lithography
2023 · Seung Woo Lee, Heyjin Cho, et al. · Scientific Reports · 5
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Improvement in the performance of ZnO thin film transistors by using ultralow-pressure sputtering
2011 · Myung Soo Huh, Seok-Jun Won, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2
Advancing top-emission OLEDs: Enhanced top-electrode deposition through innovative low-damage sputtering method with rotating cathode
2026 · Giwoon Sung, Jeong-Il Lee, et al. · Vacuum
18‐2: Enhanced Sputtering Process for the charateristics of electrode in OLEDs
2026 · Giwoon Sung, Soobong Kim, et al. · SID Symposium Digest of Technical Papers
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4‐3: Silicon‐Oxide Thin Films Deposited by Plasma‐Enhanced Atomic Layer Deposition for High Mobility Oxide TFT
2025 · Heeyong Lee, Choelmin Jang, et al. · SID Symposium Digest of Technical Papers
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P‐103: Ultra Fine Drop Volume Measurement Technic using Chromatic Confocal Sensor(CCS) for Quantum Dot Inkjet Printing Process
2024 · Jae Bum Pahk, Konta Yu, et al. · SID Symposium Digest of Technical Papers
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22‐1: Formation of Silicon‐Based Thin‐Film Encapsulation for Fabrication of Highly Flexible OLED Devices
2020 · Eun Jung, Myung Soo Huh, et al. · SID Symposium Digest of Technical Papers
Improvement in the Device Characteristics of Tin Oxide Thin-film Transistors by Adopting Ultralow-Pressure Sputtering
2010 · Myung Soo Huh, Bong Sop Yang, et al. · ECS Transactions
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Interface Analysis of Transparent Analog Capacitor Using ITO Electrodes and ALD High-k Dielectrics
2009 · Seok-Jun Won, Myung Soo Huh, et al. · ECS Transactions
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Improvement in the Device Characteristics of Tin Oxide Thin-film Transistors by Adopting Ultralow-Pressure Sputtering
2009 · Myung Soo Huh, Bong Sop Yang, et al. · ECS Meeting Abstracts
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Interface Analysis of Transparent Analog Capacitor Using ITO Electrodes and ALD High-k Dielectrics
2009 · Seok-Jun Won, Myung Soo Huh, et al. · ECS Meeting Abstracts
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Works count: 20
Citation count: 280
H-index: 8
I10-index: 8
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