Author

X. Jian

Observed name: X Jian
ORCID: 0009-0000-8064-7645
Observed ORCID: 0009-0000-8064-7645
OpenAlex ID: A5112087519
2007 · X. Jian, S. Dixon, et al. · Journal of Applied Physics · 106
2006 · X. Jian, S. Dixon, et al. · Sensors and Actuators A Physical · 104
2006 · X. Jian, Y. Fan, et al. · Journal of Applied Physics · 94
2005 · R.S. Edwards, S. Dixon, et al. · Ultrasonics · 91
2007 · Y. Fan, S. Dixon, et al. · NDT & E International · 84
2005 · R.S. Edwards, A. Sophian, et al. · NDT & E International · 75
2006 · X. Jian, S. Dixon, et al. · Ultrasonics · 74
2008 · X. Jian, S. Dixon, et al. · Sensors and Actuators A Physical · 46
2005 · R. S. Edwards, X. Jian, et al. · Applied Physics Letters · 43
2006 · X. Jian, S. Dixon, et al. · The Journal of the Acoustical Society of America · 41
2006 · X. Jian, S. Dixon · Sensors and Actuators A Physical · 38
2004 · R S Edwards, S Dixon, et al. · Journal of Physics D Applied Physics · 36
2006 · X. Jian, S. Dixon, et al. · Ultrasonics · 33
2007 · I Baillie, P Griffith, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 30
2004 · S Dixon, R S Edwards, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 29
2006 · X. Jian, S. Dixon, et al. · Proceedings/Proceedings - IEEE Ultrasonics Symposium · 23
2004 · X Jian, S Dixon, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 23
2007 · X Jian, I Baillie, et al. · Journal of Physics D Applied Physics · 21
2006 · X. Jian, S. Dixon, et al. · Applied Physics Letters · 19
2005 · X. Jian, S. Dixon, et al. · Nondestructive Testing And Evaluation · 18
2007 · X. Jian, S. Dixon, et al. · Journal of Applied Physics · 16
2005 · X. Jian, J.P. Weight, et al. · Sensors and Actuators A Physical · 11
2005 · X. Jian · AIP conference proceedings · 10
Works count: 34
Citation count: 1,125
H-index: 19
I10-index: 25
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