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Takanori Komuro

Observed name: Takanori KOMURO
OpenAlex ID: A5112248772
Multichannel SQUID system detecting tangential components of the cardiac magnetic field
1995 · Keiji Tsukada, Yasuhiro Haruta, et al. · Review of Scientific Instruments · 69
Sampling clock jitter effects in digital-to-analog converters
2002 · Naoki Kurosawa, Haruo Kobayashi, et al. · Measurement · 37
Total Harmonic Distortion Measurement System of Electronic Devices up to 100 MHz With Remarkable Sensitivity
2007 · Takanori Komuro, Shingo Sobukawa, et al. · IEEE Transactions on Instrumentation and Measurement · 20
Multitone curve‐fitting algorithms for communication application ADC testing
2003 · Yoshito Motoki, Hidetake Sugawara, et al. · Electronics and Communications in Japan (Part II Electronics) · 8
Characterization for High-Performance CMOS Using In-Wafer Advanced Kelvin-Contact Device Structure
2009 · Rihito Kuroda, Akinobu Teramoto, et al. · IEEE Transactions on Semiconductor Manufacturing · 6
Characterization of MOSFETs intrinsic performance using in-wafer advanced Kelvin-contact device structure for high performance CMOS LSIs
2008 · Rihito Kuroda, Akinobu Teramoto, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 6
Algorithms for Digital Correction of ADC Nonlinearity
2003 · Haruo Kobayashi, Hiroshi Yagi, et al. · IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences · 2
New Method for Evaluating Heat Transfer Material
2013 · Yasuhiro Saito, Hiroyuki Emoto, et al. · ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK) · 1
The New Method for Evaluating Heat Transfer Material
2013 · Yasuhiro Saito, Takanori Komuro · Journal of The Japan Institute of Electronics Packaging · 1
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THD Measurement and Compensation for Analog Circuits with Fine CMOS Devices
2007 · Takanori Komuro, Shingo Sobukawa, et al. · International Conference on Solid State Devices and Materials (SSDM) · 1
Timing Error Analysis in Digital-to-Analog Converter : Effects of Sampling Clock Jitter and Timing Skew(Glitch)
2001 · Haruo Kobayashi, N. Kurosawa, et al. · 1
The New Evaluation Method of Thermal Interface Material Using Non-smooth Plate
2016 · Yasuhiro SAITO, Takanori KOMURO · Transactions of the Society of Instrument and Control Engineers
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The Detection of Minimum BLT Condition With Electrical Capacitance Measurement
2015 · Yasuhiro Saito, Satoru Suzuki, et al. · ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK)
A Study Based on the Open Circuit Voltage to Measure the Remaining Charge of the Nickel-Metal Hydride Battery
2015 · 博幸 江元, 貴紀 小室, et al. · Institutional Repositories DataBase (IRDB)
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Evaluation of thermal interface material with electric capacitance measurement: A new method using metal meshes to present finer surface roughness levels
2014 · Yasuhiro Saito, Satoru Suzuki, et al. · IEEE CPMT Symposium Japan (ICSJ)
9-330 Introduction of new experiencing educational programs in e electrical and electronics class : A challenge for the design education in Kanagawa Institute of Technology
2010 · Tsugutomo Kudo, Katsumi Nakatsuhara, et al.
Accuracy and Applicability of Low-Frequency $C$–$V$ Measurement Methods for Characterization of Ultrathin Gate Dielectrics With Large Current
2007 · Rihito Kuroda, Akinobu Teramoto, et al. · IEEE Transactions on Electron Devices
Multi-tone Curve Fitting Algorithm for ADC Performance Testing in Frequency Domain
2002 · Yoshito Motoki, Hidetake Sugawara, et al. · Proceedings of the Society Conference of IEICE
Works count: 18
Citation count: 152
H-index: 6
I10-index: 3
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