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R. I. Vorobey

Observed names: Roman VOROBEY, Roman Vorobey
ORCID: 0000-0003-2851-6108
Observed ORCID: 0000-0003-2851-6108
OpenAlex ID: A5112596350
Surface Electric Potential Measurement with a Static Probe
2023 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements · 5
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Influence of Rapid Thermal Treatment of Initial Silicon Wafers on the Electrophysical Properties of Silicon Dioxide Obtained by Pyrogenous Oxidation
2019 · Vladimir A. Pilipenko, Vitaly A. Solodukha, et al. · High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes · 5
Controlling the characteristics of photovoltaic cells based on their own semiconductors
2015 · Roman VOROBEY · PRZEGLĄD ELEKTROTECHNICZNY · 5
Characterization of the Electrophysical Properties of Silicon-silicon Dioxide Interface Using Probe Electrometry Methods
2017 · V. А. Pilipenko, V. A. Saladukha, et al. · Devices and Methods of Measurements · 4
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Analysis of the Electrophysical and Photoelectric Properties of Nanocomposite Polymers by the Modified Kelvin Probe
2017 · K. U. Pantsialeyeu, A. U. Krautsevich, et al. · Devices and Methods of Measurements · 3
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Photoelectric semiconductor converters with a large dynamic range
2014 · R. I. Vorobey, О. К. Гусев, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 3
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Digital Contact Potential Probe in Studying the Deformation of Dielectric Materials
2020 · Kanstantsin Pantsialeyeu, Anatoly Zharin, et al. · Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska · 2
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Kelvin Probe's Stray Capacitance and Noise Simulation
2014 · S. Danyluk, А. В. Дубаневич, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 2
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X-ray Diffraction Method in the Study of a Metal Surface Stress State Under Static and Impact Deformation
2023 · A. P. Kren, M. N. Delendik, et al. · Devices and Methods of Measurements · 1
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Charge-Sensitive Technique for Deformation Processes’ Study
2022 · K. U. Pantsialeyeu, U. A. Mikitsevich, et al. · Devices and Methods of Measurements · 1
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Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity
2021 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements
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Сканирующая Фотостимулированная Электрометрия Для Контроля Однородности Распределения Параметров Полупроводниковых Пластин
2020 · Andrei Tyavlovsky, Anatoly Zharin, et al. · Современные тенденции развития физики полупроводников: достижения, проблемы и перспективы
Kelvin Probe Self-calibration Mode for Semiconductor Wafers Properties Monitoring
2015 · R. I. Vorobey, O. K. Gusev, et al. · DOAJ (DOAJ: Directory of Open Access Journals)
Calculation of Metrological Characteristics of pH Control System for Mixture of Acids and Alkalis
2004 · R. I. Vorobey, O. K. Gusev · Science & Technique
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Works count: 14
Citation count: 31
H-index: 4
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