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David M. Holburn

Observed names: D Holburn, D M Holburn, D. Holburn, D. M. Holburn, D.M. Holburn, DD M Holburn, DM Holburn, David Holburn, David M Holburn, David M. Holburn A, David M. Holburn D, HOLBURN, DM, Holburn, DM
OpenAlex ID: A5111610431
Integrated transceivers for optical wireless communications
2005 · D.C. O'Brien, G.E. Faulkner, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 95
A combined heart rate and movement sensor: proof of concept and preliminary testing study
2000 · K Rennie, T Rowsell, et al. · European Journal of Clinical Nutrition · 83
High-speed integrated transceivers for optical wireless
2003 · D.C. O'Brien, G.E. Faulkner, et al. · IEEE Communications Magazine · 66
Experimental demonstration of cascaded AWG access network featuring bi-directional transmission and polarization multiplexing
2004 · Ioannis Tsalamanis, Etienne Rochat, et al. · Optics Express · 33
On‐line computation of diffractograms for the analysis of SEM images
1980 · S. J. Erasmus, D. M. Holburn, et al. · Scanning · 29
Design of Low-Noise High-Gain CMOS Transimpedance Amplifier for Intelligent Sensing of Secondary Electrons
2015 · Joon Huang Chuah, David Holburn · IEEE Sensors Journal · 27
An automatic focusing and stigmating system for the SEM
1979 · W J Tee, K C A Smith, et al. · Journal of Physics E Scientific Instruments · 22
Real time analysis of fetal phonography signals using the TMS320
1989 · D.M. Holburn, T.D. Rowsell · 16
Design and analysis of a low-power highly linear mixer
2009 · Jiming Jiang, David M Holburn · European Conference on Circuit Theory and Design · 13
World wide web‐controlled scanning electron microscope
1997 · G. Chand, B. C. Breton, et al. · Scanning · 12
Experimental characterization of integrated optical wireless components
2006 · D.C. O'Brien, G.E. Faulkner, et al. · IEEE Photonics Technology Letters · 10
A pattern recognition technique using sequences of marks for registration in electron beam lithography
1981 · D. M. Holburn, G. A. C. Jones, et al. · Journal of Vacuum Science and Technology · 10
Sharpness search algorithms for automatic focusing in the scanning electron microscope
2001 · CF Batten, DM Holburn, et al. · 9
Switch-level timing verification for CMOS circuits: a semianalytic approach
1990 · H.-G. Yang, D.M. Holburn · IEE Proceedings G Circuits Devices and Systems · 9
On-line topographic analysis in the SEM
1979 · DM Holburn, Kca Smith · Cambridge University Engineering Department Publications Database · 9
A CMOS Imaging Diversity Receiver Chip with a Flip-Chip Integrated Detector Array for Optical Wireless Links
2006 · Valencia Joyner, David Holburn, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 8
High-speed integrated optical wireless transceivers for in-building optical LANs
2001 · Dominic C. O'Brien, Grahame E. Faulkner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
Mono-Type TFT Logic Architectures for Low Power Systems on Panel Applications
2016 · Yifan Yang, Sungsik Lee, et al. · Journal of Display Technology · 7
Design of low‐noise CMOS transimpedance amplifier
2013 · Joon Huang Chuah, David Holburn · Microelectronics International · 7
Development of a CMOS 310-Mb/s receiver for free-space optical wireless links
2001 · Vinod A. Lalithambika, Valencia M. Joyner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
Topographical analysis in the SEM using an automatic focusing technique
1982 · D. M. Holburn, K. C. A. Smith · Journal of Microscopy · 7
An integrated solid-state solution for secondary electron detection
2013 · Joon Huang Chuah, David Holburn · Analog Integrated Circuits and Signal Processing · 6
WebXpertEze: intelligent instruments via the Internet
2000 · Nicholas Caldwell, BC Breton, et al. · Cambridge University Engineering Department Publications Database · 5
SEM Autofocusing and Astigmatism Correction using FFT and GPGPU techniques
2013 · N.H. Caldwell, A.J. Marshall, et al. · Microscopy and Microanalysis · 4
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Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
2011 · J Chuah, D Holburn · Microscopy and Microanalysis · 4
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Works count: 118
Citation count: 573
H-index: 10
I10-index: 12
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