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Chun Kin Chan
Observed names:
C.K. Chan,
Chun K. Chan
Observed institution:
AT&T (United States)
OpenAlex ID:
A5113521623
Estimation of thin-oxide reliability using proportional hazards models
1990
·
E.A. Elsayed
, C.K. Chan
·
IEEE Transactions on Reliability
·
57
A proportional hazards approach to correlate SiO/sub 2/-breakdown voltage and time distributions
1990
·
C.K. Chan
·
IEEE Transactions on Reliability
·
27
Temperature-dependent standard deviation of log(failure time) distributions
1991
·
C.K. Chan
·
IEEE Transactions on Reliability
·
21
Reliability and security modeling in upgrading wireless backbone networks
2004
·
Chun K. Chan
, Himanshu Pant
·
Bell Labs Technical Journal
·
11
The role of SLAs in reducing vulnerabilities and recovering from disasters
2004
·
Chun K. Chan
, Uma Chandrashekhar
, et al.
·
Bell Labs Technical Journal
·
9
Oxide defect densities and related breakdown lifetimes
1986
·
C.K. Chan
, H.A. Waggener
·
Thin Solid Films
·
9
Spares-inventory sizing for end-to-end service availability
2002
·
C.K. Chan
, M. Tortorella
·
Annual Reliability and Maintainability Symposium (RAMS)
·
8
Incorporating the downtime due to disaster events in the network reliability model
2004
·
A.M. Jrad
, C.K. Chan
, et al.
·
International Telecommunications Network Strategy and Planning Symposium
·
7
Analysis of parameter-degradation data using life-data analysis programs
2002
·
Chun Kin Chan
, M. Boulanger
, et al.
·
Annual Reliability and Maintainability Symposium (RAMS)
·
7
Sequential sampling plans for early-life reliability assessment
2002
·
Chun Kin Chan
, C.I. Seraidaridia
, et al.
·
Annual Reliability and Maintainability Symposium (RAMS)
·
6
Design of a packet voice transmission system
1979
·
Hideaki Tanaka
, C.K. Chan
, et al.
·
ntc
·
5
Availability analysis of load-sharing systems
2003
·
Chun Kin Chan
·
Annual Reliability and Maintainability Symposium (RAMS)
·
2
Compensating effects in time-dependent dielectric breakdown (MOS capacitors)
1992
·
C.K. Chan
, M.B. Carey
·
IEEE Transactions on Reliability
·
2
A brink of failure and breach of security detection and recovery system
2003
·
Andrew R. McGee
, Chun K. Chan
, et al.
·
Bell Labs Technical Journal
·
1
Power-related failure mechanisms in the analysis of wireless system availability
2002
·
Chun Kin Chan
, T. Doumi
, et al.
·
Annual Reliability and Maintainability Symposium (RAMS)
·
1
Confidence Intervals for Hardware Reliability Predictions
2002
·
Chun Kin Chan
, Michael Tortorella
·
Wiley series in probability and statistics
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Works count:
16
Citation count:
173
H-index:
7
I10-index:
4
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