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C. Alfonso

Coexistence of clusters, GPB zones, S″-, S′- and S-phases in an Al–0.9% Cu–1.4% Mg alloy
2000 · A. Charai, T. Walther, et al. · Acta Materialia · 188
The meandering of steps and the terrace width distribution on clean Si(111)
1992 · C. Alfonso, J.M. Bermond, et al. · Surface Science · 182
Comments on “cluster hardening in an aged Al-Cu-Mg alloy”
1998 · A.M Zahra, C.Y Zahra, et al. · Scripta Materialia · 58
About the sublimation of Si surfaces vicinal of {111}
1993 · C. Alfonso, J.C. Heyraud, et al. · Surface Science · 53
Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case
2010 · V. Chamard, J. Stangl, et al. · Physical Review Letters · 41
Transmission electron microscopy investigation of tin sub-oxide nucleation upon SnO2 deposition on silicon
1996 · Claude Alfonso, Ahmed Charaï, et al. · Applied Physics Letters · 24
Reflection electron microscopy studies of the step meandering and evaporation on vicinal surfaces of silicon
1995 · J.M. Bermond, J.J. Métois, et al. · Surface Science · 20
Ferromagnetic MnCoGe thin films produced via magnetron sputtering and non-diffusive reaction
2017 · A. Portavoce, E. Assaf, et al. · Applied Surface Science · 18
Simple approach for the fabrication of PEDOT-coated Si nanowires
2015 · Mingxuan Zhu, Marielle Eyraud, et al. · Beilstein Journal of Nanotechnology · 13
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On the mechanism ruling the morphology of silicon nanowires obtained by one-pot metal-assisted chemical etching
2020 · Stefano Magagna, Dario Narducci, et al. · Nanotechnology · 12
Effect of a Ti diffusion barrier on the cobalt silicide formation: solid solution, segregation and reactive diffusion
2020 · Hannes Zschiesche, Claude Alfonso, et al. · Acta Materialia · 10
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Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin films
2019 · H. Zschiesche, A.P.C. Campos, et al. · Ultramicroscopy · 10
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Origin of the superstructure elucidated by atomic resolution HAADF-STEM and HREM in the Ce 10 W 22 O 81 lanthanide tungstate phase
2018 · Loïc Patout, Abdelali Hallaoui, et al. · Journal of Applied Crystallography · 10
Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction
2007 · L. Alexandre, K. Rousseau, et al. · Micron · 10
Dislocation nucleation in heteroepitaxial semiconducting films
2009 · B. Pichaud, N. Burle, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 9
Gold coverage and faceting of MBE grown silicon nanowires
2013 · Thomas David, Luc Roussel, et al. · Journal of Crystal Growth · 8
Structural and optoelectronical characterization of Si–SiO2/SiO2 multilayers with applications in all Si tandem solar cells
2010 · D. Maestre, O. Palais, et al. · Journal of Applied Physics · 8
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HOLZ lines splitting on SiGe/Si relaxed samples: Analytical solutions for the kinematical equation
2009 · C. Alfonso, L. Alexandre, et al. · Ultramicroscopy · 8
About the sublimation of Si surfaces vicinal of {111}
1993 · C. Alfonso, J.C. Heyraud, et al. · Surface Science Letters · 7
Interfacial Modification Induced by Equilibrium Segregation in Ge(S) Bicrystal
1998 · A. Charaï, L. Fares, et al. · Surface Review and Letters · 6
Residual Stresses in Metallic Multilayers
1996 · O. Thomas, P. Gergaud, et al. · Journal de Physique IV (Proceedings) · 6
A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface
1995 · J. C. Heyraud, J. M. Bermond, et al. · Journal de Physique I · 6
Ti segregation at CoSi grain boundaries
2018 · Hannes Zschiesche, Ahmed Charaï, et al. · Microelectronic Engineering · 5
Molecular diodes in optical rectennas
2016 · David Duché, Ujwol Palanchoke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Microstructure and residual stresses in (111) multilayers
1996 · S. Labat, B. Pichaud, et al. · Thin Solid Films · 5
Works count: 57
Citation count: 750
H-index: 10
I10-index: 14
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