Get started
Author

Shin-Ping Huang

Flexible low-temperature polycrystalline silicon thin-film transistors
2020 · T.-C. Chang, Y.-C. Tsao, et al. · Materials Today Advances · 89
PDF
Effects of Repetitive Mechanical Bending Strain on Various Dimensions of Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
2016 · Bo-Wei Chen, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 47
Surface Engineering of Polycrystalline Silicon for Long-Term Mechanical Stress Endurance Enhancement in Flexible Low-Temperature Poly-Si Thin-Film Transistors
2017 · Bo-Wei Chen, Ting-Chang Chang, et al. · ACS Applied Materials & Interfaces · 46
Investigation of the Capacitance–Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
2019 · Hong-Chih Chen, Chuan-Wei Kuo, et al. · ACS Applied Materials & Interfaces · 43
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
2019 · Hong-Yi Tu, Tsung-Ming Tsai, et al. · IEEE Electron Device Letters · 35
A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs
2019 · Hong-Chih Chen, Guan-Fu Chen, et al. · IEEE Electron Device Letters · 29
Gate Modulation of Excitatory and Inhibitory Synaptic Plasticity in a Low-Temperature Polysilicon Thin Film Synaptic Transistor
2018 · Nian Duan, Yi Li, et al. · ACS Applied Electronic Materials · 25
Systematic Analysis of High-Current Effects in Flexible Polycrystalline-Silicon Transistors Fabricated on Polyimide
2017 · Bo-Wei Chen, Hsin-Lu Chen, et al. · IEEE Transactions on Electron Devices · 23
Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
2020 · Shin-Ping Huang, Hong-Chih Chen, et al. · IEEE Transactions on Electron Devices · 21
Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide
2016 · Bo-Wei Chen, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 20
Abnormal hump in capacitance–voltage measurements induced by ultraviolet light in a-IGZO thin-film transistors
2017 · Yu-Ching Tsao, Ting-Chang Chang, et al. · Applied Physics Letters · 18
Enhancing Repetitive Uniaxial Mechanical Bending Endurance at ${R} = 2$ mm Using an Organic Trench Structure in Foldable Low Temperature Poly-Si Thin-Film Transistors
2019 · Shin-Ping Huang, Yu-Zhe Zheng, et al. · IEEE Electron Device Letters · 16
Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs
2019 · Hong-Chih Chen, Hong-Yi Tu, et al. · IEEE Electron Device Letters · 14
A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
2020 · Yu-Xuan Wang, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 11
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
2019 · Shin-Ping Huang, Po-Hsun Chen, et al. · IEEE Electron Device Letters · 11
Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions
2020 · Yu-Xuan Wang, Mao-Chou Tai, et al. · IEEE Transactions on Electron Devices · 10
Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs
2020 · Yu-Zhe Zheng, Shin-Ping Huang, et al. · IEEE Electron Device Letters · 10
Abnormal ${C}$ –${V}$ Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
2019 · Shin-Ping Huang, Yao-Kai Shih, et al. · IEEE Transactions on Electron Devices · 8
Reliability Test Integrating Electrical and Mechanical Stress at High Temperature for a-InGaZnO Thin Film Transistors
2019 · Yu-Ching Tsao, Ting-Chang Chang, et al. · IEEE Transactions on Device and Materials Reliability · 7
Effects of Ultraviolet Light on the Dual-Sweep $I$ – $V$ Curve of a-InGaZnO4 Thin-Film Transistor
2019 · Yu-Ching Tsao, Ting-Chang Chang, et al. · IEEE Transactions on Electron Devices · 7
Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors
2020 · Hong-Yi Tu, Ting-Chang Chang, et al. · Journal of Physics D Applied Physics · 6
Investigation of the forming process under UV illumination in HfO 2 -based resistance random access memory with a transparent electrode
2019 · Wei-Chen Huang, Shin-Ping Huang, et al. · Journal of Physics D Applied Physics · 6
PDF
An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors
2019 · Guan-Fu Chen, Hong-Chih Chen, et al. · IEEE Transactions on Electron Devices · 6
Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film Transistors
2018 · Chung-I Yang, Ting-Chang Chang, et al. · IEEE Transactions on Electron Devices · 6
Joint Caching, Communication, and Trajectory Optimization in Air-Ground Integrated Wireless Networks With Multiple UAVs and Multiple BSs
2024 · Yi-Mo Lin, Shin-Ping Huang, et al. · IEEE Access · 4
PDF
Works count: 35
Citation count: 533
H-index: 13
I10-index: 17
Year
Topic
Type