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Author

Saeid Karimpour

Observed institution: Iowa State University
ORCID: 0009-0009-6669-8812
Observed ORCID: 0009-0009-6669-8812
OpenAlex ID: A5114231322
Low-Cost Direct Digital Synthesis-Based On-Chip Waveform Generation for Analog/Mixed Signal BIST Applications
2025 · Emmanuel Nti Darko, Isaac Bruce, et al. · Metrology · 8
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Direct Current to Digital Converter (DIDC): A Current Sensor
2024 · Saeid Karimpour, Michael Sekyere, et al. · Sensors · 6
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs
2024 · Saeid Karimpour, Isaac Bruce, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 6
High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters
2025 · Emmanuel Nti Darko, Saeid Karimpour, et al. · IEEE VLSI Test Symposium (VTS) · 5
Ultra-Low Leakage Current Sensor With Large Dynamic Range
2025 · Emmanuel Nti Darko, Saeid Karimpour, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 3
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Compact and Accurate On-Chip Sensor for BTI-Induced Aging in Integrated Circuits
2025 · Kelvin Tamakloe, Daniel Adjei, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 3
Ultra-Pure High-Resolution Waveform Generation Using Low-Cost Data Converters with Dithering
2025 · Emmanuel Nti Darko, Saeid Karimpour, et al. · IEEE International Test Conference (ITC) · 2
A $2.6ppm /^{\circ}C$ Curvature Compensated MOS Subthreshold Voltage Reference with no Amplifiers
2025 · Michael Sekyere, Daniel Adjei, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 2
A Simple Monitor for Tracking Leakage Current in Capacitors for Reliability Assessment
2025 · Emmanuel Nti Darko, Saeid Karimpour, et al. · IEEE Microelectronics Design & Test Symposium (MDTS) · 2
A Back-Gate Corner-Closure Methodology for All-Digital Multi-Modulus Dividers in 22 nm FDSOI
2026 · Saeid Karimpour, Emmanuel Nti Darko, et al. · Electronics · 1
An On-Chip Sensor For Online Monitoring of HCI-Induced Aging In Integrated Analog Circuits
2025 · Saeid Karimpour, Emmanuel Nti Darko, et al. · IEEE International Test Conference (ITC) · 1
A Low-Power, High-Resolution DIDC for Non-Invasive Current Sensing in SoC Power Delivery Networks
2025 · Saeid Karimpour, Emmanuel Nti Darko, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 1
Gradient Minimization in Layout Patterns for Analog Circuits
2025 · Isaac Bruce, Michael Sekyere, et al. · Circuits Systems and Signal Processing · 1
A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity
2025 · Emmanuel Nti Darko, Isaac Bruce, et al. · IEEE International Symposium on Circuits and Systems proceedings · 1
Direct Current To Digital Converter (DCDC): A Current Sensor
2024 · Saeid Karimpour, Michael Sekyere, et al. · Preprints.org · 1
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Deterministic Foreground Calibration of Gain and Integral Nonlinearity in Constant-Slope Digital-to-Time Converters for Fractional Output Dividers
2026 · Saeid Karimpour, Emmanuel Nti Darko, et al. · Sensors
High-Purity, Low-Cost DAC-Based Multitone Waveform Generation for Built-In-Self-Test Applications
2026 · Emmanuel Nti Darko, Saeid Karimpour, et al. · IEEE VLSI Test Symposium (VTS)
A Physics-Informed Machine Learning Framework for Electromigration Time-to-Failure Prediction
2026 · Saeid Karimpour, Emmanuel Nti Darko, et al. · IEEE VLSI Test Symposium (VTS)
A Fully Integrated Monolithic Monitor for Aging-Induced Leakage Current Characterization
2025 · Emmanuel Nti Darko, Saeid Karimpour, et al. · Sensors
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A 2.6ppm/◦C Curvature Compensated MOS Subthreshold Voltage Reference with No Amplifiers
2025 · Michael Sekyere, Daniel Adjei, et al.
Works count: 20
Citation count: 43
H-index: 4
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