Author

Vinay Bist

Observed name: Bist, Vinay
Observed institution: DELL (United States)
ORCID: 0009-0008-5067-7374
Observed ORCID: 0009-0008-5067-7374
OpenAlex ID: A5116284330
2026 · Taiwo Blessing Ogunseyi, Gogulakrishan Thiyagarajan, et al. · Sensors · 32
2025 · Gogulakrishnan Thiyagarajan, Vinay Bist, et al. · International Journal of Scientific Research in Computer Science Engineering and Information Technology · 7
2025 · Gogulakrishnan Thiyagarajan, Vinay Bist, et al. · International Journal of Computer Applications · 4
2025 · Gogulakrishnan Thiyagarajan, Vinay Bist, et al. · SSRN Electronic Journal · 3
2026 · Nayak, Prabhudarshi, Thiyagarajan, Gogulakrishnan, et al. · arXiv (Cornell University)
2026 · Nayak, Prabhudarshi, Thiyagarajan, Gogulakrishnan, et al. · arXiv (Cornell University)
Works count: 6
Citation count: 46
H-index: 3
I10-index: 1
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