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Xiaotong Shu
Institutions:
Jiangsu Normal University,
Henan University of Science and Technology,
Chinese Academy of Sciences,
Institute of Chemistry,
University of Chinese Academy of Sciences
Observed institutions:
Jiangsu Normal University,
Henan University of Science and Technology,
Chinese Academy of Sciences,
Institute of Chemistry,
University of Chinese Academy of Sciences
ORCID:
0009-0002-7888-4101
Observed ORCID:
0009-0002-7888-4101
OpenAlex ID:
A5116732380
Review of wafer defect detection based on supervised learning algorithms
2026
·
Xiaotong Shu
, Guo Ye
, et al.
·
Engineering Computations
·
2
Wafer Defect Detection Based on YOLO-BA
2024
·
Xiaotong Shu
, Lin Xu
, et al.
·
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)
·
2
High-Damping Elastomers Enabled by Precise Regulation of Polyborosiloxane Relaxation Behaviors
2026
·
Fu-Long Gong
, Xiaotong Shu
, et al.
·
Chemistry of Materials
Wafer-YOLO: A lightweight object detection network for wafer inspection
2026
·
Xiaotong Shu
, Zhenzhi He
, et al.
·
Microelectronics Journal
A lightweight high precision real-time system for bonding ball–pad localization in industrial packaging inspection
2026
·
Haoran Wei
, Zhenzhi He
, et al.
·
Measurement Science and Technology
Drying and rheological characteristics of ultrasound-enhanced far-infrared radiation drying on cherry tomato pulp
2026
·
Shubei Dong
, Leqian Wang
, et al.
·
Journal of Food Measurement & Characterization
Optimized Sol–Gel Synthesis of Elastic Silicone Resins With Balanced Thermal Stability and Mechanical Properties
2026
·
Shuang Long
, Fu‐Long Gong
, et al.
·
Journal of Applied Polymer Science
Wafer-YOLO: A Lightweight Object Detection Network for Wafer Inspection
2026
·
Xiaotong Shu
, Zhenzhi He
, et al.
·
SSRN Electronic Journal
Wafer-YOLO: A Lightweight Object Detection Network for Wafer Inspection
2026
·
Xiaotong Shu
, Zhenzhi He
, et al.
·
SSRN Electronic Journal
A lightweight ghost-driven attention network for wire bond positioning in measurement
2025
·
Haoran Wei
, Xiaotong Shu
, et al.
·
Engineering Research Express
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Works count:
10
Citation count:
4
H-index:
2
I10-index:
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