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Ichiro Seike
Institution:
Kyoto Institute of Technology
Observed institution:
Kyoto Institute of Technology
ORCID:
0009-0005-2155-1818
Observed ORCID:
0009-0005-2155-1818
OpenAlex ID:
A5116739159
Ni/rutile GeO2 vertical Schottky barrier diode on Nb-doped TiO2 substrate using Sb-doped graded Ge y Sn1−y O2 buffer layers
2025
·
Kazutaka Kanegae
, Kazuki Shimazoe
, et al.
·
Applied Physics Express
·
11
Enhanced growth temperature window and Sb doping of rutile GeO 2 enabled by graded buffer layers
2025
·
Kazuki Shimazoe
, Ichiro Seike
, et al.
·
Japanese Journal of Applied Physics
·
7
Bismuth-assisted stabilization of rutile GeO2 thin films grown by Mist-CVD
2026
·
Carolina Fernández-Saiz
, Kazuki Shimazoe
, et al.
·
Applied Surface Science
·
2
Epitaxial growth of Rutile GeO2 by Mist CVD and its application to Schottky barrier diodes
2026
·
Hiroyuki Nishinaka
, Kazutaka Kanegae
, et al.
Bismuth-Assisted Stabilization of Rutile GeO₂ Thin Films Grown by Mist-CVD
2025
·
Carolina Fernandez Saiz
, Kazuki Shimazoe
, et al.
·
SSRN Electronic Journal
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Works count:
5
Citation count:
20
H-index:
2
I10-index:
1
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