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Y. Boussida
Institution:
University of Eloued
Observed institution:
University of Eloued
OpenAlex ID:
A5116847742
Fabrication and Characterization of Nanostructured NiO and NiO:Cu Thin Films at Varied Copper Concentrations
2025
·
Y. Boussida
, Y. Aoun
, et al.
·
Journal of Nano- and Electronic Physics
·
2
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Works count:
1
Citation count:
2
H-index:
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