Author

Einav Raveh

Institution: Technion – Israel Institute of Technology

Observed institution: Technion – Israel Institute of Technology

OpenAlex ID: A5118130335

Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current

2025 · Mor M. Dahan, Emanuel Ber, et al. · IEEE International Memory Workshop (IMW) · 1

Works count: 1

Citation count: 1

H-index: 1

I10-index: