Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
G. Ridgard
Observed names:
George Ridgard,
Ridgard, G.,
Ridgard, George
Observed institution:
Lancaster University
ORCID:
0000-0002-5106-9628
Observed ORCID:
0000-0002-5106-9628
OpenAlex ID:
A5118592068
Voltage noise thermometry in integrated circuits at millikelvin temperatures
2025
·
G. Ridgard
, M. Thompson
, et al.
·
Journal of Applied Physics
·
1
Fast On-Chip Thermometry with TiN Kinetic Inductance Resonators in 22 nm Process Technology
2026
·
Drayne, Johann
, Ridgard, George
, et al.
·
arXiv (Cornell University)
PDF
Characterization of Heat Transfer in 3-D CMOS Structures Using Sideband Scanning Thermal Wave Microscopy
2026
·
Valentin Fonck
, Mohammadali Razeghi
, et al.
·
IEEE Transactions on Instrumentation and Measurement
Show more works
View as search
Works count:
5
Citation count:
1
H-index:
1
I10-index:
Year
Topic
Type