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Atte Hoffrén

Observed names: Atte L. J. Hoffrén, Hoffrén, Atte
Observed institution: ABB (Finland)
ORCID: 0009-0005-3100-1131
Observed ORCID: 0009-0005-3100-1131
OpenAlex ID: A5120013445
Early Detection of Wire Bond Degradation in IGBT Modules Using On-Chip Junction Temperature Sensor
2025 · Joonas A. R. Leppänen, Atte L. J. Hoffrén, et al. · IEEE Transactions on Power Electronics · 2
Multiphysics Simulations for IGBT Power Semiconductor Module Cooling
2025 · Péter Pálovics, Eeli Kerttula, et al. · International Workshop on Thermal Investigations of ICs and Systems · 1
In-Situ Analysis of Solder Degradation in IGBT Power Semiconductor Modules Using On-Chip Temperature Sensors
2026 · Joonas Leppänen, Atte Hoffrén, et al. · IEEE Transactions on Power Electronics
Works count: 5
Citation count: 3
H-index: 1
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