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Songbin Li
Institution:
Wuxi University
Observed institution:
Wuxi University
ORCID:
0009-0004-6704-2317
Observed ORCID:
0009-0004-6704-2317
OpenAlex ID:
A5123619700
Micro-Scratch Detection on Wafer Surfaces Based on Strip Convolution and High-Resolution Feature Reconstruction
2026
·
Dan Jiang
, Songbin Li
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
A Method for Precise Detection of Wafer Probe Needle Marks Based on Deep Learning
2026
·
Xuyan Zhang
, Songbin Li
, et al.
·
SSRN Electronic Journal
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2
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