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Author

Ramesh Karri

Observed names: Karri, Ramesh, R Karri
Institution: New York University
Observed institution: New York University
OpenAlex ID: A5124020384
HarmChip: Evaluating Hardware Security Centric LLM Safety via Jailbreak Benchmarking
2026 · Wang, Zeng, Shao, Minghao, et al. · arXiv (Cornell University) · 6
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CTFExplorer: Evaluating LLM Offensive Agents Through Multi-Target Web CTF Benchmarking
2026 · Rani, Nanda, Milner, Kimberly, et al. · arXiv (Cornell University) · 4
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Hybrid-NL2SVA: Integrating RAG and Finetuning for LLM-based NL2SVA
2025 · Weihua Xiao, Derek Ekberg, et al. · ACM/IEEE Workshop on Machine Learning for CAD (MLCAD) · 4
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From Natural Language to Silicon: The Representation Bottleneck in LLM Hardware Design
2026 · Fu, Weimin, Wang, Zeng, et al. · arXiv (Cornell University) · 3
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TrojanGYM: A Detector-in-the-Loop LLM for Adaptive RTL Hardware Trojan Insertion
2026 · Sreekumar, Saideep, Wang, Zeng, et al. · arXiv (Cornell University) · 3
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Configuration Over Selection: Hyperparameter Sensitivity Exceeds Model Differences in Open-Source LLMs for RTL Generation
2026 · Minghao Shao, Zeng Wang, et al. · IEEE International Conference on LLM-Aided Design (ICLAD) · 2
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LLM4PQC - Accurate and Efficient Synthesis of PQC Cores by Feedback-Driven LLMs
2026 · Perera, Buddhi, Wang, Zeng, et al. · arXiv (Cornell University) · 2
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RESCORE: LLM-Driven Simulation Recovery in Control Systems Research Papers
2026 · Bhat, Vineet, Wei, Shiqing, et al. · arXiv (Cornell University) · 1
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AI In Cybersecurity Education -- Scalable Agentic CTF Design Principles and Educational Outcomes
2026 · Xi, Haoran, Shao, Minghao, et al. · arXiv (Cornell University) · 1
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VeriInteresting: An Empirical Study of Model Prompt Interactions in Verilog Code Generation
2026 · Collini, Luca, Hennesee, Andrew, et al. · arXiv (Cornell University) · 1
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Special Day – GUIDE: GenAI Units In Digital Design Education
2026 · Weihua Xiao, Jason Blocklove, et al. · Design, Automation, and Test in Europe
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サイバー物理システムのためのプロセスを意識したサイドチャネル成形と透かし【jst・京大機械翻訳】
2018 · P Krishnamurthy, F Khorrami, et al. · IEEE Conference Proceedings
Works count: 12
Citation count: 27
H-index: 3
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