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Jinlan Li
Institution:
Yangzhou University
Observed institution:
Yangzhou University
ORCID:
0009-0005-6601-3271
Observed ORCID:
0009-0005-6601-3271
OpenAlex ID:
A5124179547
Contrasting degradation mechanisms and switching responses of 1.2-kV SiC MOSFETs under long-term positive and negative high-temperature gate bias stress
2026
·
Jinlan Li
, Quanzhi Chen
, et al.
·
Microelectronics Journal
Avalanche Failure Mechanisms of 1200-V/40-A 4H-SiC Junction Barrier Schottky Diodes With Various Epilayer Defects
2026
·
Jinlan Li
, Yan Xu
, et al.
·
IEEE Transactions on Device and Materials Reliability
A High-Reliability SiC Trench MOSFET IntegratingLateral JBS Diode With Enhanced ReverseConduction and Short-Circuit Capability
2026
·
Jinlan Li
, Huaren Sheng
, et al.
·
SSRN Electronic Journal
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Works count:
3
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