Author

Xinyuan Yang

Institution: Shanghai Jiao Tong University

Observed institution: Shanghai Jiao Tong University

OpenAlex ID: A5124435252

Crystallographic orientation and depth-dependent residual stress in 6-Inch 4H-SiC boules with varying defect states

2026 · Tianzi Xu, Pucong Sheng, et al. · Materials Today Communications

Works count: 1

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