Author

A. Pavel

Institution: IMEC

Observed institution: IMEC

OpenAlex ID: A5124451485

Improving IGZO transistor PBTI reliability with hydrogen anneal achieving overdrive voltage of 1.2V for a lifetime of 5 years at 95°C

2025 · A. Chasin, J. Franco, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 1

Interfacial Engineering of Scaled HZO in 3D-Trench BEOL-Compatible FeCAPs for High Endurance (≥10 13 cy.) and 2 P R (>40 μ C/cm 2 ) at Low (≥1.3 V) Operating Bias

2026 · J. Bizindavyi, M.I. Popovici, et al.

Works count: 2

Citation count: 1

H-index: 1

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