Author

Andy Shen

Institution: Hubei Jiufengshan Laboratory

Observed institution: Hubei Jiufengshan Laboratory

ORCID: 0009-0007-4607-3941

Observed ORCID: 0009-0007-4607-3941

OpenAlex ID: A5127521537

Twist angle measurement of a SiC-SiC bonded wafer interface via electron diffraction

2026 · Beitian Zheng, Xu Chen, et al. · Surfaces and Interfaces · 1

Characterization of Twist and Tilt Misalignments in the Direct WaferBonding Process: A Case Study of LiNbO3 on Oxidized Si

2026 · Beitian Zheng, Xu Chen, et al. · Langmuir

First demonstration of 8-in. N-polar GaN HEMT wafer via wafer bonding and layer transfer

2026 · Chengguo Li, Andy Shen · APL Materials

Works count: 3

Citation count: 1

H-index: 1

I10-index: