Author

Kihang Youn

Observed name: Youn, Kihang

Institution: Nvidia (United States)

Observed institution: Nvidia (United States)

OpenAlex ID: A5128646477

Agentic TCAD Calibration Workflow for Oxide Semiconductor Transistors

2026 · Jeong, Gyujun, Lee, Junmo, et al. · arXiv (Cornell University)

Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model

2026 · Jeong, Gyujun, Cho, Sungwon, et al. · arXiv (Cornell University)

Works count: 2

Citation count:

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