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Min‐Ho Kang

Observed name: Min-Ho Kang
Observed institution: National NanoFab Center
ORCID: 0009-0001-0832-2827
Observed ORCID: 0009-0001-0832-2827
OpenAlex ID: A5130773788
Structural and electrical characterization of Hf0.5Zr0.5O2 thin films crystallized by rapid thermal annealing
2026 · Jucheol Park, Yeong Gyeong Park, et al. · Han-guk hyeonmigyeong hakoeji/Applied microscopy · 2
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High-Pressure Deuterium Annealing Effect on HfO 2 -Based Gate-All-Around Ferroelectric FET
2026 · Min-Jae Choi, Ju-Won Yeon, et al. · IEEE Electron Device Letters · 1
Works count: 2
Citation count: 3
H-index: 1
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