Author

浩一 (産総研) 平田

Observed names: 平田, 浩一, 平田, 浩一 (産総研), 平田, 浩一(産総研)

OpenAlex ID: A5132004493

Experimental characterization of ultrafast phenomena of secondary-ion emission induced by nanoscale energy deposition processes of energetic C60 impacts

2020 · 平田, 浩一(産総研), Yamada, Keisuke, et al. · Institutional Repositories DataBase (IRDB)

池田の定理の拡張について

2018 · 平田, 浩一, 四宮, 雅士 · Institutional Repositories DataBase (IRDB)

Highly-sensitive time-of-flight secondary ion mass spectrometry with high energy cluster ion beams

2018 · 平田, 浩一 (産総研), 山田, 圭介, et al. · Institutional Repositories DataBase (IRDB)

Works count: 3

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