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Byung Chul Choi

Observed name: Byung Yong Choi
Observed institution: Samsung Electronics (South Korea)
ORCID: 0000-0002-7427-6697
Observed ORCID: 0000-0002-7427-6697
OpenAlex ID: A5133211334
Effective defect detection in 3D V-NAND flash memory using color-based image processing
2026 · Jiwon Shin, Byung Yong Choi, et al. · Metrology, Inspection, and Process Control XXXVI
Works count: 1
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