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Jochen Wilhelm
Observed name:
Wilhelm, Jochen
Institution:
Fraunhofer Institute for Integrated Systems and Device Technology
Observed institution:
Fraunhofer Institute for Integrated Systems and Device Technology
ORCID:
0009-0008-6877-2468
Observed ORCID:
0009-0008-6877-2468
OpenAlex ID:
A5134093263
In Situ Coating Thickness Measurement of Parylene Using a Capacitive Sensor
2026
·
Manuel Seidenath
, Daniel Jäger
, et al.
·
Electronic Materials
·
1
Parylene Capping for Prolonged Stability of Perovskite Solar Cells
2026
·
Ajdič Žan
, Jannik H. Schwarberg
, et al.
·
Solar RRL
Parylene Capping for Prolonged Stability of Perovskite Solar Cells
2026
·
Žan, Ajdiˇ
, Schwarberg, Jannik H.
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
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Works count:
3
Citation count:
1
H-index:
1
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