Author

Wei Ni

Observed name: Ni, Wei
ORCID: 0000-0002-4933-594X
Observed ORCIDs: 0000-0002-4933-594X, 0000-0003-0780-4637
OpenAlex ID: A5136313696
2026 · Yang Lu, Shengli Zhang, et al. · IEEE Communications Surveys & Tutorials · 28
2026 · Zhongchi Wang, Hailong Sun, et al. · IEEE Transactions on Dependable and Secure Computing · 6
2026 · Suirui Zhu, Xin Yuan, et al. · IEEE Transactions on Knowledge and Data Engineering · 2
2026 · Cai, Lingyi, Zhang, Yu, et al. · arXiv (Cornell University) · 2
2026 · Jingjing Zheng, Xin Yuan, et al. · ACM Transactions on Privacy and Security · 1
2026 · Li, Kai, Cai, Hanlin, et al. · arXiv (Cornell University)
2026 · Xiao, Bingnan, Yang, Chenhao, et al. · arXiv (Cornell University)
2026 · Xiao, Bingnan, Gao, Yuan, et al. · arXiv (Cornell University)
2026 · Conggai Li, Wei Ni, et al. · IEEE Transactions on Knowledge and Data Engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
2026 · Kai Li, Xin Yuan, et al. · Springer series in reliability engineering
Works count: 24
Citation count: 41
H-index: 2
I10-index: 1
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