Author

Y. Mansouri

Institution: University Frères Mentouri Constantine 1

Observed institution: University Frères Mentouri Constantine 1

OpenAlex ID: A5144287358

Study of electrical and X-ray induced degradation in 55-nm BiCMOS SiGe heterojunction bipolar transistors

2026 · M. Bouhouche, A. Adebabay Belie, et al. · Microelectronics Reliability

Works count: 1

Citation count:

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